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STM8S207R8T6C 参数 Datasheet PDF下载

STM8S207R8T6C图片预览
型号: STM8S207R8T6C
PDF下载: 下载PDF文件 查看货源
内容描述: 性能线, 24兆赫STM8S 8位MCU ,高达128 KB闪存,集成的EEPROM , 10位ADC ,定时器, 2个UART , SPI , I²C , CAN [Performance line, 24 MHz STM8S 8-bit MCU, up to 128 Kbytes Flash, integrated EEPROM,10-bit ADC, timers, 2 UARTs, SPI, I²C, CAN]
分类和应用: 闪存微控制器和处理器外围集成电路装置PC可编程只读存储器电动程控只读存储器电可擦编程只读存储器时钟
文件页数/大小: 103 页 / 1740 K
品牌: STMICROELECTRONICS [ ST ]
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Package characteristics  
STM8S207xx, STM8S208xx  
11.2  
Thermal characteristics  
The maximum chip junction temperature (T  
) must never exceed the values given in  
Jmax  
Table 18: General operating conditions on page 56.  
The maximum chip-junction temperature, T  
using the following equation:  
, in degrees Celsius, may be calculated  
Jmax  
T
= T  
+ (P  
x Θ )  
Jmax  
Amax  
Dmax JA  
Where:  
T
is the maximum ambient temperature in °C  
is the package junction-to-ambient thermal resistance in ° C/W  
Amax  
Θ
JA  
P
is the sum of P  
and P  
(P  
= P  
+ P  
)
I/Omax  
Dmax  
INTmax  
I/Omax  
Dmax  
INTmax  
P
is the product of I and V , expressed in Watts. This is the maximum chip  
INTmax  
DD  
DD  
internal power.  
P
P
represents the maximum power dissipation on output pins, where:  
I/Omax  
I/Omax  
= Σ (V *I ) + Σ((V -V *I ), and taking account of the actual V /I and  
OL OL  
DD OH) OH  
OL OL  
V
/I of the I/Os at low and high level in the application.  
OH OH  
(1)  
Table 57. Thermal characteristics  
Symbol  
Parameter  
Value  
Unit  
Thermal resistance junction-ambient  
LQFP 80 - 14 x 14 mm  
Θ
38  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
JA  
Thermal resistance junction-ambient  
LQFP 64 - 14 x 14 mm  
Θ
45  
46  
57  
54  
60  
JA  
Thermal resistance junction-ambient  
LQFP 64 - 10 x 10 mm  
Θ
JA  
Thermal resistance junction-ambient  
LQFP 48 - 7 x 7 mm  
Θ
JA  
Thermal resistance junction-ambient  
LQFP 44 - 10 x 10 mm  
Θ
JA  
Thermal resistance junction-ambient  
LQFP 32 - 7 x 7 mm  
Θ
JA  
1. Thermal resistances are based on JEDEC JESD51-2 with 4-layer PCB in a natural convection  
environment.  
11.2.1  
Reference document  
JESD51-2 integrated circuits thermal test method environment conditions - natural  
convection (still air). Available from www.jedec.org.  
96/103  
Doc ID 14733 Rev 9