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STM32F100C8T6BTR 参数 Datasheet PDF下载

STM32F100C8T6BTR图片预览
型号: STM32F100C8T6BTR
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内容描述: 低和中等密度值线,先进的基于ARM的32位MCU低和中等密度值线,先进的基于ARM的32位MCU [Low & medium-density value line, advanced ARM-based 32-bit MCU Low & medium-density value line, advanced ARM-based 32-bit MCU]
分类和应用:
文件页数/大小: 84 页 / 1148 K
品牌: STMICROELECTRONICS [ ST ]
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STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB  
Electrical characteristics  
The above formula (Equation 1) is used to determine the maximum external impedance allowed for an  
error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).  
(1)  
Table 42.  
R
max for f  
= 12 MHz  
AIN  
ADC  
Ts (cycles)  
tS (µs)  
RAIN max (k)  
1.5  
0.125  
0.625  
1.125  
2.375  
3.45  
0.4  
7.5  
5.9  
13.5  
28.5  
41.5  
55.5  
71.5  
239.5  
11.4  
25.2  
37.2  
50  
4.625  
5.96  
NA  
20  
NA  
1. Guaranteed by design, not tested in production.  
(1)(2)  
Table 43. ADC accuracy - limited test conditions  
Symbol  
Parameter  
Test conditions  
Typ  
Max  
Unit  
ET  
EO  
EG  
ED  
EL  
Total unadjusted error  
Offset error  
1.3  
1
2
fPCLK2 = 24 MHz,  
fADC = 12 MHz, RAIN < 10 k,  
VDDA = 3 V to 3.6 V  
TA = 25 °C  
1.5  
1.5  
1
Gain error  
0.5  
0.7  
0.8  
LSB  
Differential linearity error  
Integral linearity error  
Measurements made after  
ADC calibration  
1.5  
1. ADC DC accuracy values are measured after internal calibration.  
2. Based on characterization, not tested in production.  
(1) (2)  
Table 44. ADC accuracy  
Symbol  
Parameter  
Test conditions  
Typ  
Max(3)  
Unit  
ET  
EO  
EG  
ED  
EL  
Total unadjusted error  
Offset error  
2
5
2.5  
3
f
PCLK2 = 24 MHz,  
1.5  
1.5  
1
fADC = 12 MHz, RAIN < 10 k,  
VDDA = 2.4 V to 3.6 V  
Gain error  
LSB  
Measurements made after  
ADC calibration  
Differential linearity error  
Integral linearity error  
2
1.5  
3
1. ADC DC accuracy values are measured after internal calibration.  
2. Better performance could be achieved in restricted VDD, frequency, VREF and temperature ranges.  
3. Based on characterization, not tested in production.  
Note:  
ADC accuracy vs. negative injection current: Injecting a negative current on any of the  
standard (non-robust) analog input pins should be avoided as this significantly reduces the  
accuracy of the conversion being performed on another analog input. It is recommended to  
add a Schottky diode (pin to ground) to standard analog pins which may potentially inject  
Doc ID 16455 Rev 2  
67/84  
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