欢迎访问ic37.com |
会员登录 免费注册
发布采购

STM32F302RC 参数 Datasheet PDF下载

STM32F302RC图片预览
型号: STM32F302RC
PDF下载: 下载PDF文件 查看货源
内容描述: ARM的Cortex- M4F 32B MCUFPU ,高达256 KB的SRAM Flash48KB [ARM Cortex-M4F 32b MCUFPU, up to 256KB Flash48KB SRAM]
分类和应用: 静态存储器
文件页数/大小: 133 页 / 2061 K
品牌: STMICROELECTRONICS [ ST ]
 浏览型号STM32F302RC的Datasheet PDF文件第122页浏览型号STM32F302RC的Datasheet PDF文件第123页浏览型号STM32F302RC的Datasheet PDF文件第124页浏览型号STM32F302RC的Datasheet PDF文件第125页浏览型号STM32F302RC的Datasheet PDF文件第127页浏览型号STM32F302RC的Datasheet PDF文件第128页浏览型号STM32F302RC的Datasheet PDF文件第129页浏览型号STM32F302RC的Datasheet PDF文件第130页  
Package characteristics  
STM32F302xx/STM32F303xx  
7.2  
Thermal characteristics  
The maximum chip junction temperature (T max) must never exceed the values given in  
J
Table 22: General operating conditions on page 58.  
The maximum chip-junction temperature, T max, in degrees Celsius, may be calculated  
J
using the following equation:  
T max = T max + (P max x Θ )  
J
A
D
JA  
Where:  
T max is the maximum ambient temperature in °C,  
A
Θ
is the package junction-to-ambient thermal resistance, in °C/W,  
JA  
P max is the sum of P  
max and P max (P max = P  
max + P max),  
INT I/O  
D
INT  
I/O  
D
P
max is the product of I and V , expressed in Watts. This is the maximum chip  
DD DD  
INT  
internal power.  
P
max represents the maximum power dissipation on output pins where:  
I/O  
P
max = Σ (V × I ) + Σ((V – V ) × I ),  
OL OL DD OH OH  
I/O  
taking into account the actual V / I and V / I of the I/Os at low and high level in the  
OL OL  
OH OH  
application.  
Table 79. Package thermal characteristics  
Symbol  
Parameter  
Value  
Unit  
Thermal resistance junction-ambient  
LQFP64 - 10 × 10 mm / 0.5 mm pitch  
45  
Thermal resistance junction-ambient  
LQFP48 - 7 × 7 mm  
ΘJA  
55  
41  
°C/W  
Thermal resistance junction-ambient  
LQFP100 - 14 × 14 mm / 0.5 mm pitch  
7.2.1  
Reference document  
JESD51-2 Integrated Circuits Thermal Test Method Environment Conditions - Natural  
Convection (Still Air). Available from www.jedec.org  
126/133  
Doc ID 023353 Rev 5  
 
 
 复制成功!