STB28NM50N, STF28NM50N, STP28NM50N, STW28NM50N
Test circuits
3
Test circuits
Figure 19. Gate charge test circuit
V
DD
12V
2200
Figure 18. Switching times test circuit for
resistive load
47kΩ
100nF
1kΩ
R
L
V
GS
V
D
R
G
P
W
D.U.T.
µF
3.3
µF
V
DD
V
i
=20V=V
GMAX
2200
µF
I
G
=CONST
100Ω
2.7kΩ
47kΩ
P
W
1kΩ
AM01469v1
D.U.T.
V
G
AM01468v1
Figure 20. Test circuit for inductive load
Figure 21. Unclamped inductive load test
switching and diode recovery times
circuit
A
D
G
S
B
25
Ω
D.U.T.
A
FAST
DIODE
B
A
L=100µH
B
D
G
3.3
µF
1000
µF
L
V
D
2200
µF
3.3
µF
V
DD
V
DD
I
D
R
G
S
V
i
D.U.T.
P
w
AM01470v1
AM01471v1
Figure 22. Unclamped inductive waveform
V
(BR)DSS
V
D
Figure 23. Switching time waveform
t
on
td
on
t
r
t
off
td
off
t
f
90%
I
DM
90%
10%
I
D
V
DD
V
DD
0
10%
V
DS
90%
V
GS
AM01472v1
0
10%
AM01473v1
Doc ID 17432 Rev 2
9/21