M95040, M95020, M95010
Table 21. AC Characteristics (M950x0-W, Device Grade 3)
Test conditions specified in Table 11. and Table 9.
3
3
4
4
Symbol
Alt.
Parameter
Unit
MHz
ns
Min.
Max.
Min.
Max.
f
C
f
Clock Frequency
D.C.
200
200
200
200
200
200
2
D.C.
90
5
SCK
CSS1
CSS2
t
t
t
S Active Setup Time
S Not Active Setup Time
S Deselect Time
SLCH
t
90
ns
SHCH
t
t
100
90
ns
SHSL
CS
t
t
CSH
S Active Hold Time
S Not Active Hold Time
Clock High Time
ns
CHSH
t
90
ns
CHSL
1
t
90
ns
t
CLH
CH
1
t
Clock Low Time
Clock Rise Time
200
90
ns
µs
t
CLL
CL
2
t
1
1
1
1
t
RC
CLCH
2
t
Clock Fall Time
µs
ns
ns
ns
ns
ns
t
FC
CHCL
t
t
DSU
Data In Setup Time
40
50
20
30
70
40
60
DVCH
t
t
Data In Hold Time
CHDX
DH
t
Clock Low Hold Time after HOLD not Active
Clock Low Hold Time after HOLD Active
Clock High Set-up Time before HOLD Active
140
90
HHCH
t
HLCH
t
t
CHHL
CH
Clock High Set-up Time before HOLD not
Active
t
t
60
ns
CHHH
CH
2
t
Output Disable Time
Clock Low to Output Valid
Output Hold Time
250
150
100
60
ns
ns
ns
t
DIS
SHQZ
t
t
CLQV
V
t
t
HO
0
0
CLQX
2
t
Output Rise Time
100
100
100
250
10
50
50
50
100
5
ns
ns
ns
ns
ms
t
RO
QLQH
2
t
Output Fall Time
t
FO
QHQL
t
t
LZ
HOLD High to Output Valid
HOLD Low to Output High-Z
Write Time
HHQV
2
t
t
HZ
HLQZ
t
W
t
WC
Note: 1. t + t must never be less than the shortest possible clock period, 1 / f (max)
CH
CL
C
2. Value guaranteed by characterization, not 100% tested in production.
3. Previous product: identified by Process Identification letter K.
4. Present product: identified by Process Identification letter W or G.
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STMICROELECTRONICS [ ST ]
