M27C512
Table 7. Read Mode DC Characteristics
(1)
Symbol
Min
Max
±10
±10
Unit
µA
Parameter
Input Leakage Current
Output Leakage Current
Test Condition
I
LI
0V ≤ V ≤ V
IN
CC
I
LO
0V ≤ V
≤ V
µA
OUT CC
E = V , G = V ,
IL
IL
I
Supply Current
30
mA
CC
I
= 0mA, f = 5MHz
OUT
I
E = V
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Program Current
1
mA
µA
µA
V
CC1
IH
I
E > V – 0.2V
CC
100
10
CC2
I
PP
V
= V
PP CC
V
Input Low Voltage
–0.3
2
0.8
IL
(2)
V
+ 1
Input High Voltage
V
V
V
V
V
IH
CC
V
I
= 2.1mA
= –1mA
Output Low Voltage
0.4
OL
OL
I
Output High Voltage TTL
Output High Voltage CMOS
3.6
OH
V
OH
I
= –100µA
V
– 0.7V
CC
OH
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V
.
CC
PP
PP
2. Maximum DC voltage on Output is V +0.5V.
CC
Table 8. Read Mode AC Characteristics
M27C512
(1)
(3)
Symbol Alt
Parameter
-60
-70
-80
Unit
Test Condition
-45
Min Max Min Max Min Max Min Max
Address Valid to
Output Valid
t
t
t
t
E = V , G = V
45
45
25
25
25
60
60
30
25
25
70
70
35
30
30
80
80
40
30
30
ns
ns
ns
ns
ns
ns
AVQV
ACC
IL
IL
Chip Enable Low to
Output Valid
t
G = V
ELQV
CE
IL
Output Enable Low
to Output Valid
t
E = V
IL
GLQV
OE
Chip Enable High
to Output Hi-Z
(2)
t
t
t
G = V
0
0
0
0
0
0
0
0
0
0
0
0
t
DF
DF
IL
EHQZ
Output Enable
High to Output Hi-Z
(2)
E = V
t
IL
GHQZ
Address Transition
to Output Transition
t
E = V , G = V
IL IL
AXQX
OH
Note: 1. V must be applied simultaneously with or before V and removed simultaneously or after V .
PP
CC
PP
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed AC measurement conditions.
11/22
STMICROELECTRONICS [ ST ]
