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1740077-1 参数 Datasheet PDF下载

1740077-1图片预览
型号: 1740077-1
PDF下载: 下载PDF文件 查看货源
内容描述: 连接系统为光伏制造商 [Connectivity Systems for PV Manufacturers]
分类和应用:
文件页数/大小: 44 页 / 3150 K
品牌: STMICROELECTRONICS [ STMICROELECTRONICS ]
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SOLARLOK Connectivity Systems for PV Manufacturers
Mechanical, Environmental and Electrical Testing Capabilities
Force-deflection curves are generated to verify that
spring contact properties meet design criteria.
Contact resistance and temperature rise are measured
and recorded automatically. These parameters help to
establish/verify current carrying capacity, and de-rating
curves. Test samples are isolated to minimize the
influence of external variables such as air movement.
Components/assemblies are exposed to cold, heat,
moisture, and temperature change. Thermal shock
is accomplished with the 2-chamber method.
Environmental chambers operate from -70°C to +180°C
enabling simulation of real-world conditions.
Slow-motion bending and vibration testing simulates
line movements in the wire, stressing the crimped
termination. Industrial atmospheres are generated
with a gas mixture of SO2, H2S, NO2 and Cl2.
3D X-ray computer tomography provides high
resolution three-dimensional non-destructive
analysis capability.
2
te.com/solar
Catalog 3-1773458-7 | Issue Date 04/2011
Dimensions are in inches and millimeters unless otherwise specified.
Values in brackets are standard equivalents. Dimensions are shown
for reference purposes only. Specifications subject to change.
USA: 1-800-522-6752
Canada: +1-905-475-6222
Mexico: +52 (0) 55-1106-0800
Latin/S. America: +54 (0) 11-4733-2200
Germany: +49 (0) 6251-133-1999
UK: +44 (0) 800-267666
France: +33 (0) 1-3420-8686
Netherlands: +31 (0) 73-6246-999
China: +86 (0) 400-820-6015