PS3072
Through-hole Phototransistor/φ3 Type
Reliability Testing Result
Reliability Testing
Applicable Standard
Testing Conditions
Duration
1,000 h
Failure
Result
Room Temp.
Operating Life
EIAJ ED-
4701/100(101)
Ta = 25℃, Pc = Maxium Rated Power Dissipation
265±5℃, 3mm from package base
0/16
0/16
Resistance to
Soldering Heat
EIAJ ED-
4701/300(302)
5s
Minimum Rated Storage Temperature(30min)
～Normal Temperature(15min)
～Maximum Rated Storage Temperature(30min)
～Normal Temperature(15min)
EIAJ ED-
4701/100(105)
Temperature Cycling
5 cycles
0/16
Wet High Temp.
Storage Life
EIAJ ED-
4701/100(103)
Ta = 60±2℃, RH = 90±5%
1,000 h
1,000 h
1,000 h
10s
0/16
0/16
0/16
0/16
0/16
High Temp.
Storage Life
EIAJ ED-
4701/200(201)
Ta = Maximum Rated Storage Temperature
Ta = Minimum Rated Storage Temperature
10N,1time (□0.4 and Flat Package : 5N)
Low Temp.
Storage Life
EIAJ ED-
4701/200(202)
EIAJ ED-
4701/400(401)
Lead Tension
98.1m/s2 (10G), 100 ～ 2KHz sweep for 20min.,
XYZ each direction
Vibration,
Variable Frequency
EIAJ ED-
4701/400(403)
2 h
Failure Criteria
Items
Symbols
Conditions
Failure criteria
E
E Value of each product
Irradiance of Photo Current
CE Value of each product
Collector-emitter Voltage of
Photo Current
Testing Max. Value ≧Initial Value x 1.3
Testing Min. Value ≦ Initial Value x 0.7
Photo Current
IC
V
CEO
V
Value of each product
Dark Current
ICEO
Collector-emitter Voltage of Dark
Current
Testing Max. Value ≧ Spec. Max. Value x 1.2
Occurrence of notable decoloration,
deformation and cracking
Cosmetic Appearance
-
-
2007.8.31
Page 9
STANLEY [ STANLEY ELECTRIC CO.,LTD. ]
