3864K Series
Single Color Flush Mount Round Shape Type
Reliability Testing Result
Reliability Testing
Applicable Standard
Testing Conditions
Duration
1,000 h
Failure
0/25
Result
Room Temp.
Operating Life
EIAJ ED-
4701/100(101)
F
Ta = 25℃, I = Maxium Rated Current
Resistance to
Soldering Heat
EIAJ ED-
4701/300(302)
260±5℃, 1.6mm from package base
10s
0/25
Minimum Rated Storage Temperature(30min)
~Normal Temperature(15min)
~Maximum Rated Storage Temperature(30min)
~Normal Temperature(15min)
EIAJ ED-
4701/100(105)
Temperature Cycling
5 cycles
0/25
Wet High Temp.
Storage Life
EIAJ ED-
4701/100(103)
Ta = 60±2℃, RH = 90±5%
1,000 h
1,000 h
1,000 h
10s
0/25
0/25
0/25
0/10
0/10
High Temp.
Storage Life
EIAJ ED-
4701/200(201)
Ta = Maximum Rated Storage Temperature
Ta = Minimum Rated Storage Temperature
10N,1time (□0.4 and Flat Package : 5N)
Low Temp.
Storage Life
EIAJ ED-
4701/200(202)
EIAJ ED-
4701/400(401)
Lead Tension
98.1m/s2 (10G), 100 ~ 2KHz sweep for 20min.,
XYZ each direction
Vibration,
Variable Frequency
EIAJ ED-
4701/400(403)
2 h
Failure Criteria
Items
Symbols
Conditions
Failure criteria
F
I Value of each product
Luminous Intensity
Luminous Intensity
Iv
Testing Min. Value < Spec. Min. Value x 0.5
Testing Max. Value ≧ Spec. Max. Value x 1.2
Testing Max. Value ≧ Spec. Max. Value x 2.5
F
I Value of each product
F
Forward Voltage
Reverse Current
V
Forward Voltage
R
V = Maximum Rated
R
I
Reverse Voltage V
Occurrence of notable decoloration,
deformation and cracking
Cosmetic Appearance
-
-
2007.8.31
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