KW1448A
5.0 x 5.0 mm (t=0.55 mm) Type White LED
Reliability Testing Result
Reliability Testing Result Applicable Standard
Testing Conditions
Duration
1000 h
Failure
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
0/20
Room Temp.
EIAJ ED-
F
Ta = 25℃, I = 50mA/1chip
Operating Life
4701/100(101)
High Temp.
EIAJ ED-
F
Ta = 85℃ ,I = 20mA/1chip
1000 h
1000 h
Operating Life
4701/100(101)
Low Temp.
EIAJ ED-
F
Ta = -30℃, I = 50mA/1chip
Operating Life
4701/100(101)
Wet High Temp.
Operating Life
EIAJ ED-
4701/100(102)
F
Ta = 60℃, 90%, I = 35mA/1chip
1000 h
Dynamic
EIAJ ED-
Ta = 60℃, IFRM = 100mA/1chip,
Pulse Width = 0.1s, Duty = 1/20
20,000 cycles
1,000 h
Operating Life
4701/100(101)
Wet High Temp.
Storage Life
EIAJ ED-
4701/100(103)
Ta = 60℃, 90%
EIAJ ED-
4701/100(105)
Thermal Shock
Ta = -40℃ ～ 100℃ (each 15min.)
Ta = 120℃
200 cycles
1,000 h
High Temp.
Storage Life
EIAJ ED-
4701/200(201)
Low Temp.
Storage Life
EIAJ ED-
4701/200(202)
Ta = -40℃
1,000 h
Cycled Temp.
Humidity Life
EIAJ ED-
4701/200(203)
Ta = -10℃ ～ 65℃, 95%, 24h/cycle
10 cycles
Preheat : 150 ～ 180℃(120s Max.)
Soldering Temp. : 260℃(5s)
Moisture Soak : 30℃, 70%, 72h
Resistance to
Reflow Soldering
EIAJ ED-
4701/300(301)
Twice
0/20
Electric Static Discharge
(ESD)
EIAJ ED-
4701/300(304)
C = 100pF, R2 = 1.5KΩ, ±1,000V
once each polarity
2 h
0/20
0/20
98.1m/s2 (10G), 100 ～ 2KHz, 20min,
XYZ each direction
Vibration,
Variable Frequency
EIAJ ED-
4701/400(403)
Failure Criteria
Items
Symbols
Conditions
Failure criteria
F
Luminous Intensity
Iv
I =40mA/1chip
Testing Min. Value ＜ Spec. Min. Value x 0.5
Testing Max. Value ≧ Spec. Max. Value x 1.2
Testing Max. Value ≧ Spec. Max. Value x 2.5
F
Forward Voltage
Reverse Current
V
IF=40mA/1chip
R
I
R
V =5V/1chip
Occurrence of notable decoloration,
deformation and cracking
Cosmetic Appearance
-
-
Page12
2009.2.26
STANLEY [ STANLEY ELECTRIC CO.,LTD. ]
