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SST89E54RD2-33-C-TQJ 参数 Datasheet PDF下载

SST89E54RD2-33-C-TQJ图片预览
型号: SST89E54RD2-33-C-TQJ
PDF下载: 下载PDF文件 查看货源
内容描述: FlashFlex51 MCU [FlashFlex51 MCU]
分类和应用:
文件页数/大小: 91 页 / 969 K
品牌: SST [ SILICON STORAGE TECHNOLOGY, INC ]
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FlashFlex51 MCU  
SST89E52RD2 / SST89E54RD2 / SST89E58RD2 / SST89E516RD2  
SST89V52RD2 / SST89V54RD2 / SST89V58RD2 / SST89V516RD2  
Preliminary Specifications  
2. Capacitive loading on Ports 0 & 2 may cause spurious noise to be superimposed on the VOLs of ALE and Ports 1 & 3. The noise due  
to external bus capacitance discharging into the Port 0 & 2 pins when the pins make 1-to-0 transitions during bus operations. In the  
worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to  
qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input.  
3. Load capacitance for Port 0, ALE & PSEN#= 100pF, load capacitance for all other outputs = 80pF.  
4. Capacitive loading on Ports 0 & 2 may cause the VOH on ALE and PSEN# to momentarily fall below the VDD - 0.7 specification when  
the address bits are stabilizing.  
5. Pins of Ports 1, 2 & 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its  
maximum value when VIN is approximately 2V.  
6. Pin capacitance is characterized but not tested. EA# is 25pF (max).  
©2004 Silicon Storage Technology, Inc.  
S71255-00-000  
3/04  
73  
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