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SST25VF032B-50-4I-SCF 参数 Datasheet PDF下载

SST25VF032B-50-4I-SCF图片预览
型号: SST25VF032B-50-4I-SCF
PDF下载: 下载PDF文件 查看货源
内容描述: 32兆位的SPI串行闪存 [32 Mbit SPI Serial Flash]
分类和应用: 闪存内存集成电路光电二极管时钟
文件页数/大小: 28 页 / 736 K
品牌: SST [ SILICON STORAGE TECHNOLOGY, INC ]
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32 Mbit SPI Serial Flash  
SST25VF032B  
Advance Information  
INSTRUCTIONS  
Instructions are used to read, write (Erase and Program),  
and configure the SST25VF032B. The instruction bus  
cycles are 8 bits each for commands (Op Code), data, and  
addresses. The Write-Enable (WREN) instruction must be  
executed prior any Byte-Program, Auto Address Increment  
(AAI) programming, Sector-Erase, Block-Erase, Write-Sta-  
tus-Register, or Chip-Erase instructions. The complete list  
of instructions is provided in Table 5.  
low before an instruction is entered and must be driven  
high after the last bit of the instruction has been shifted in  
(except for Read, Read-ID, and Read-Status-Register  
instructions). Any low to high transition on CE#, before  
receiving the last bit of an instruction bus cycle, will termi-  
nate the instruction in progress and return the device to  
standby mode. Instruction commands (Op Code),  
addresses, and data are all input from the most significant  
bit (MSB) first.  
All instructions are synchronized off a high to low transition  
of CE#. Inputs will be accepted on the rising edge of SCK  
starting with the most significant bit. CE# must be driven  
TABLE 5: Device Operation Instructions  
Address Dummy  
Data  
Maximum  
Instruction  
Read  
Description  
Op Code Cycle1  
Cycle(s)2 Cycle(s) Cycle(s) Frequency  
Read Memory  
0000 0011b (03H)  
3
3
3
0
1
0
1 to  
1 to ∞  
0
25 MHz  
50 MHz  
50 MHz  
High-Speed Read  
4 KByte Sector-Erase3 Erase 4 KByte of  
memory array  
32 KByte Block-Erase4 Erase 32KByte block  
of memory array  
64 KByte Block-Erase5 Erase 64 KByte block  
of memory array  
Read Memory at higher speed 0000 1011b (0BH)  
0010 0000b (20H)  
0101 0010b (52H)  
1101 1000b (D8H)  
3
3
0
0
0
0
0
0
0
50 MHz  
50 MHz  
50 MHz  
Chip-Erase  
Erase Full Memory Array  
0110 0000b (60H) or  
1100 0111b (C7H)  
Byte-Program  
AAI-Word-Program6  
To Program One Data Byte  
0000 0010b (02H)  
1010 1101b (ADH)  
3
3
0
0
1
50 MHz  
50 MHz  
Auto Address Increment  
Programming  
2 to ∞  
RDSR7  
EWSR  
WRSR  
WREN  
WRDI  
Read-Status-Register  
0000 0101b (05H)  
0
0
0
0
0
3
0
0
0
0
0
0
1 to ∞  
50 MHz  
50 MHz  
50 MHz  
50 MHz  
50 MHz  
50 MHz  
Enable-Write-Status-Register 0101 0000b (50H)  
0
Write-Status-Register  
Write-Enable  
Write-Disable  
Read-ID  
0000 0001b (01H)  
0000 0110b (06H)  
0000 0100b (04H)  
1
0
0
RDID8  
1001 0000b (90H) or  
1010 1011b (ABH)  
1 to ∞  
JEDEC-ID  
EBSY  
JEDEC ID read  
1001 1111b (9FH)  
0
0
0
0
3 to ∞  
50 MHz  
50 MHz  
Enable SO as an output RY/BY# 0111 0000b (70H)  
status during AAI programming  
0
DBSY  
Disable SO as an output RY/BY# 1000 0000b (80H)  
status during AAI programming  
0
0
0
50 MHz  
T5.0 1327  
1. One bus cycle is eight clock periods.  
2. Address bits above the most significant bit can be either VIL or VIH.  
3. 4KByte Sector Erase addresses: use AMS-A12, remaining addresses are don’t care but must be set either at VIL or VIH.  
4. 32KByte Block Erase addresses: use AMS-A15, remaining addresses are don’t care but must be set either at VIL or VIH.  
5. 64KByte Block Erase addresses: use AMS-A16, remaining addresses are don’t care but must be set either at VIL or VIH.  
6. To continue programming to the next sequential address location, enter the 8-bit command, ADH, followed by 2 bytes of data to be  
programmed. Data Byte 0 will be programmed into the initial address [A23-A1] with A0=0, Data Byte 1 will be programmed into the  
initial address [A23-A1] with A0 = 1.  
7. The Read-Status-Register is continuous with ongoing clock cycles until terminated by a low to high transition on CE#.  
8. Manufacturer’s ID is read with A0 = 0, and Device ID is read with A0 = 1. All other address bits are 00H. The Manufacturer’s ID and  
device ID output stream is continuous until terminated by a low-to-high transition on CE#.  
©2006 Silicon Storage Technology, Inc.  
S71327-00-000  
10/06  
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