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S29GL256M10TAIR10 参数 Datasheet PDF下载

S29GL256M10TAIR10图片预览
型号: S29GL256M10TAIR10
PDF下载: 下载PDF文件 查看货源
内容描述: 3.0伏只页面模式闪存具有0.23微米的MirrorBit制程技术 [3.0 Volt-only Page Mode Flash Memory featuring 0.23 um MirrorBit process technology]
分类和应用: 闪存内存集成电路光电二极管
文件页数/大小: 160 页 / 4686 K
品牌: SPANSION [ SPANSION ]
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P r e l i m i n a r y  
Refer to the DC Characteristics table for the active current specification for the  
write mode. The AC Characteristics section contains timing specification tables  
and timing diagrams for write operations.  
Write Buffer  
Write Buffer Programming allows the system write to a maximum of 16 words/32  
bytes in one programming operation. This results in faster effective programming  
time than the standard programming algorithms. See “Write Buffer” for more  
information.  
Accelerated Program Operation  
The device offers accelerated program operations through the ACC function. This  
is one of two functions provided by the WP#/ACC or ACC pin, depending on model  
number. This function is primarily intended to allow faster manufacturing  
throughput at the factory.  
If the system asserts V  
on this pin, the device automatically enters the afore-  
HH  
mentioned Unlock Bypass mode, temporarily unprotects any protected sector  
groups, and uses the higher voltage on the pin to reduce the time required for  
program operations. The system would use a two-cycle program command se-  
quence as required by the Unlock Bypass mode. Removing V  
from the WP#/  
HH  
ACC or ACC pin, depending on model number, returns the device to normal op-  
eration. Note that the WP#/ACC or ACC pin must not be at V for operations  
HH  
other than accelerated programming, or device damage may result. WP# has an  
internal pullup; when unconnected, WP# is at V  
.
IH  
Autoselect Functions  
If the system writes the autoselect command sequence, the device enters the au-  
toselect mode. The system can then read autoselect codes from the internal  
register (which is separate from the memory array) on DQ7–DQ0. Standard read  
cycle timings apply in this mode. Refer to the “Autoselect Mode” section on page  
78 and “Autoselect Command Sequence” section on page 103 sections for more  
information.  
Standby Mode  
When the system is not reading or writing to the device, it can place the device  
in the standby mode. In this mode, current consumption is greatly reduced, and  
the outputs are placed in the high impedance state, independent of the OE#  
input.  
The device enters the CMOS standby mode when the CE# and RESET# pins are  
both held at V ± 0.3 V. (Note that this is a more restricted voltage range than  
IO  
V .) If CE# and RESET# are held at V , but not within V ± 0.3 V, the device  
IH  
IH  
IO  
will be in the standby mode, but the standby current will be greater. The device  
requires standard access time (t ) for read access when the device is in either  
CE  
of these standby modes, before it is ready to read data.  
If the device is deselected during erasure or programming, the device draws ac-  
tive current until the operation is completed.  
Refer to the “DC Characteristics” section on page 122 for the standby current  
specification.  
30  
S29GLxxxM MirrorBitTM Flash Family  
S29GLxxxM_00A5 April 30, 2004  
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