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LPC47M14F-NC 参数 Datasheet PDF下载

LPC47M14F-NC图片预览
型号: LPC47M14F-NC
PDF下载: 下载PDF文件 查看货源
内容描述: 128 PIN ENGANCED超级I / O与LPC接口和USB集线器控制器 [128 PIN ENGANCED SUPER I/O CONTROLLER WITH AN LPC INTERFACE AND USB HUB]
分类和应用: 控制器PC
文件页数/大小: 205 页 / 1208 K
品牌: SMSC [ SMSC CORPORATION ]
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12 APPENDIX - TEST MODE  
12.1 BOARD TEST MODE  
Board test mode can be entered as follows:  
On the rising (deasserting) edge of PCI_RESET#, drive LFRAME# low and drive LAD[0] low.  
Exit board test mode as follows:  
On the rising (deasserting) edge of PCI_RESET#, drive either LFRAME# or LAD[0] high.  
See the “XNOR-Chain Test Mode” section below for a description of this board test mode.  
12.1.1 XNOR-Chain Test Mode  
XNOR-Chain test structure allows users to confirm that all pins are in contact with the motherboard during assembly  
and test operations. See FIGURE 49 below.  
The XNOR-Chain test structure must be activated to perform these tests. When the XNOR-Chain is activated, the  
LPC47M14x pin functions are disconnected from the device pins, which all become input pins except for one output  
pin at the end of XNOR-Chain.  
The tests that are performed when the XNOR-Chain test structure is activated require the board-level test hardware  
to control the device pins and observe the results at the XNOR-Chain output pin.  
The PCI_RESET# pin is not included in the XNOR-Chain. The XNOR-Chain output pin# is 85, GP31/FAN_TACH.  
See the following subsections for more details.  
I/O#1  
I/O#2  
I/O#3  
I/O#n  
XNor  
Out  
FIGURE 49 – XNOR-CHAIN TEST STRUCTURE  
SMSC DS – LPC47M14X  
Page 201  
Rev. 03/19/2001  
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