BTB/BTA06
Discrete Triacs(Non-Isolated/Isolated)
Fig. 7: R elative variation of gate trigger current,
holding current and latching current versus
junction temperature (typical values).
Fig. -81: R elative variation of critical rate of
decrease of main current versus (dV/dt)c (typical
values). S nubberless & Logic Level Types
IGT,IH,IL[Tj] / IG,TIH,IL [Tj=25°C]
2.5
(dI/dt)c [(dV/dt)c] / S pecified (dI/dt)c
2.4
2.2
2.0
1.8
2.0
IGT
1.6
1.4
TW
1.5
S W
BW/CW
1.2
IH & IL
1.0
0.8
0.6
0.4
1.0
0.5
(dV/dt)c (V/µs )
0.2
Tj(°C)
40 60
0.0
0.0
-40 -20
0.1
1.0
10.0
100.0
0
20
80 100 120 140
Fig. -28: R elative variation of critical rate of
decrease of main current versus (dV/dt)c (typical
values). S tandard Types
Fig. : 9R elative variation of critical rate of
decrease of main current versus junction
temperature.
(dI/dt)c [Tj] / (dI/dt)c [Tj s pecified]
6
(dI/dt)c [(dV/dt)c] / S pecified (dI/dt)c
2.0
1.8
C
5
4
3
2
1.6
1.4
B
1.2
1.0
0.8
0.6
0.4
1
0.2
0.0
(dV/dt)c (V/µs )
1.0
Tj(°C)
0
0.1
10.0
100.0
0
25
50
75
100
125
SIRECTIFIER [ SIRECTIFIER SEMICONDUCTORS ]
