TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Unit
Min
Max
Line regulation
+VRL
-VRL
+10.000 V output, TA = +25°C,
+13.5 V ≤ VCC ≤ +16.5 V
1
1
1
1
01,02,
03,04
-900
+900
-900
+500
-500
µV
-10.000 V output, TA = +25°C,
-13.5 V ≤ VEE ≤ -16.5 V
03,04,
05,06
+900
-500
+500
µV
µV
µV
mA
Load regulation
Output current
+VRLOAD +10.000 V output, TA = +25°C,
0 ≤ IL ≤ 10 mA
01,02,
03,04
-VRLOAD
-10.000 V output, TA = +25°C,
0 ≤ IL ≤ 10 mA
03,04,
05,06
+IL
1
2,3
1
01,02,
03,04
10
5
-IL
03,04,
05,06
10
5
mA
2,3
4
Output noise 3/
VOUT = 10 V, no load,
0.1 Hz ≤ BW ≤ 10 Hz,
TA = +25°C
01,02,
03,04,
05,06
150
µV/p-p
1/ Unless otherwise specified, VIN = +15 V, RL = 2 kΩ to pin 7 (common).
2/ Output voltage change as a function of temperature is determined using the box method. Each device is tested at -55°C,
+25°C, and +125°C. At each temperature the output voltage (VOUT) must fall within the rectangular area bounded by the
minimum and maximum temperatures. This method gives a maximum temperature coefficient of 9 ppm/°C and a typical
value of 3 ppm/°C.
3/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall
be guaranteed to the limits specified in table I for all lots not specifically tested.
SIZE
STANDARD
MICROCIRCUIT DRAWING
85030
A
REVISION LEVEL
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
H
6
DSCC FORM 2234
APR 97