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STK14EC16-TF15ITR 参数 Datasheet PDF下载

STK14EC16-TF15ITR图片预览
型号: STK14EC16-TF15ITR
PDF下载: 下载PDF文件 查看货源
内容描述: 256Kx16自动存储的nvSRAM [256Kx16 AutoStore nvSRAM]
分类和应用: 存储内存集成电路静态存储器光电二极管
文件页数/大小: 21 页 / 401 K
品牌: SIMTEK [ SIMTEK CORPORATION ]
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Preliminary  
STK14EC16  
After the t  
cycle time, the SRAM will once  
• Power up boot firmware routines should rewrite  
the nvSRAM into the desired state (autostore  
enabled, etc.). While the nvSRAM is shipped in a  
preset state, best practice is to again rewrite the  
nvSRAM into the desired state as a safeguard  
against events that might flip the bit inadvertently  
(program bugs, incoming inspection routines,  
etc.).  
RECALL  
again be ready for READ or WRITE operations. The  
RECALL operation in no way alters the data in the  
nonvolatile storage elements.Care must be taken so  
the controlling falling edge is glitch and ring free so  
as not to double clock the read address.  
DATA PROTECTION  
The STK14EC16 protects data from corruption dur-  
ing low-voltage conditions by inhibiting all externally  
initiated STORE and WRITE operations. The low-  
• The autostore enabled/disabled feature will reset  
to “autostore enabled” on every power down  
event captured by the nvSRAM. The application  
firmware should disable autostore on each reset  
sequence that this behavior is desired.  
voltage condition is detected when V <V  
.
CC  
SWITCH  
If the STK14EC16 is in a WRITE mode (both E and  
W low) at power-up, after a RECALL, or after a  
STORE, the WRITE will be inhibited until a negative  
transition on E or W is detected. This protects  
against inadvertent writes during power up or brown  
out conditions.  
• The V  
value specified in this datasheet  
cap  
includes a minimum and a maximum value size.  
Best practice is to meet this requirement and not  
exceed the max V  
value because the nvSRAM  
cap  
internal algorithm calculates V  
charge time  
cap  
based on this max Vcap value. Customers that  
want to use a larger V value to make sure  
cap  
NOISE CONSIDERATIONS  
The STK14EC16 is a high-speed memory and so  
must have a high-frequency bypass capacitor of 0.1  
there is extra store charge and store time should  
discuss their V size selection with Simtek to  
cap  
understand any impact on the V  
voltage level  
cap  
µF connected between both V  
pins and V  
CC  
SS  
at the end of a t  
period.  
RECALL  
ground plane with no plane break to chip V . Use  
SS  
leads and traces that are as short as possible. As  
with all high-speed CMOS ICs, careful routing of  
power, ground, and signals will reduce circuit noise.  
LOW AVERAGE ACTIVE POWER  
CMOS technology provides the STK14EC16 with  
the benefit of power supply current that scales with  
cycle time. Less current will be drawn as the mem-  
ory cycle time becomes longer than 50 ns. Figure 4  
BEST PRACTICES  
nvSRAM products have been used effectively for  
over 15 years. While ease-of-use is one of the prod-  
uct’s main system values, experience gained work-  
ing with hundreds of applications has resulted in the  
following suggestions as best practices:  
shows the relationship between I  
and READ/  
CC  
WRITE cycle time. Worst-case current consumption  
is shown for commercial temperature range,  
V
=3.6V, and chip enable at maximum frequency.  
CC  
Only standby current is drawn when the chip is dis-  
abled. The overall average current drawn by the  
STK14EC16 depends on the following items:  
• The non-volatile cells in this nvSRAM product are  
delivered from Simtek with 0x00 written in all  
cells. Incoming inspection routines at customer or  
contract manufacturer’s sites will sometimes  
reprogram these values. Final NV patterns are  
typically complex 4-byte pattern of 46 E6 49 53  
hex or more random bytes. End product’s firm-  
ware should not assume an NV array is in a set  
programmed state. Routines that check memory  
content values to determine first time system con-  
figuration, cold or warm boot status, etc. should  
always program a unique NV pattern (i.e., repeat-  
ing 4-byte pattern of 46 E6 49 53 hex) as part of  
the final system manufacturing test to ensure  
these system routines work consistently.  
1
2
3
4
5
6
The duty cycle of chip enable  
The overall cycle rate for operations  
The ratio of READs to WRITEs  
The operating temperature  
The VCC Level  
I/O Loading  
Rev 1.1  
Document Control #ML0061  
Jan, 2008  
14  
Simtek Confidential  
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