EFM32G Data Sheet
Electrical Characteristics
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Spurious-Free Dynamic Range SFDRADC
(SFDR)
200 kSamples/s, 12 bit, differen-
tial, VDD reference, ADC_CLK =
7 MHz, BIASPROG = 0x747
68
79
—
dBc
200 kSamples/s, 12 bit, differen-
tial, 2xVDD reference,ADC_CLK
= 7 MHz, BIASPROG = 0x747
—
79
—
dBc
Offset voltage
VADCOFFSET
After calibration, single-ended
After calibration, differential
—
-4
—
—
0.3
0.3
—
4
mV
mV
Thermometer output gradient
TGRADADCTH
-1.92
-6.3
—
—
mV/°C
ADC Co-
des/°C
Differential non-linearity (DNL)
DNLADC
VDD= 3.0 V, external 2.5 V ref-
erence
-1
±0.7
±1.2
4
LSB
Integral non-linearity (INL), End INLADC
point method
VDD= 3.0 V, external 2.5 V ref-
erence
—
±3
LSB
Missing codes
Gain error drift
MCADC
GAINED
—
—
—
—
—
—
3
LSB
%/°C
0.012
0.012
0.002
0.0333
0.033
0.063
1.25 V reference
2.5 V reference
1.25 V reference
2.5 V reference
%/°C
Offset error drift
OFFSETED
LSB/°C
LSB/°C
0.002
1.25
2.5
0.043
1.3
VREF voltage
VREF
1.25 V reference
2.5 V reference
1.2
2.4
V
V
2.6
VREF voltage drift
VREF_VDRIFT
VREF_TDRIFT
IVREF
1.25 V reference
2.5 V reference, VDD > 2.5 V
1.25 V reference
2.5 V reference
-12.4
-24.6
-132
-231
—
2.9
18.2
35.2
677
1271
114
82
mV/V
mV/V
µV/°C
µV/°C
µA
5.7
VREF temperature drift
VREF current consumption
272
545
67
1.25 V reference
2.5 V reference
—
55
µA
ADC and DAC VREF matching VREF_MATCH
1.25 V reference
2.5 V reference
—
99.85
100.01
—
%
—
—
%
Note:
1. Includes required contribution from the voltage reference.
2. Typical numbers given by abs(Mean) / (85 - 25).
3. Max number given by (abs(Mean) + 3x stddev) / (85 - 25).
The integral non-linearity (INL) and differential non-linearity parameters are explained in the following figures.
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