BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN
S-1004 Series
Rev.2.1_01
2. Change of detection voltage
If there is not a product with a specified detection voltage value in the S-1004 Series, the detection voltage can be
changed by using a resistance divider or a diode, as seen in Figure 41 to Figure 44.
In Figure 41 and Figure 42, hysteresis width also changes.
VDD
VDD
R
RA
RA
100 kΩ
VDD
SENSE
VSS
VDD
SENSE
VSS
VIN
VIN
OUT
CD
OUT
CD
RB
RB
GND
GND
Figure 41 Detection voltage change
when using a resistance divider
(Nch open-drain output product)
Figure 42 Detection voltage change
when using a resistance divider
(CMOS output product)
RA + RB
Remark Detection voltage =
• −VDET
• VHYS
RB
RA + RB
Hysteresis width =
RB
VDD
VDD
Vf1
Vf1
R
100 kΩ
VIN
VIN
VDD
SENSE
VSS
VDD
SENSE
VSS
OUT
CD
OUT
CD
GND
GND
Figure 43 Detection voltage change
when using a diode
Figure 44 Detection voltage change
when using a diode
(Nch open-drain output product)
(CMOS output product)
Remark Detection voltage = Vf1 + (−VDET
)
Caution 1. The above connection diagram and constant will not guarantee successful operation.
Perform thorough evaluation using the actual application to set the constant.
2. Set the constants referring to "2. 1 Error when detection voltage is set externally" in
" Operation".
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SII [ SEIKO INSTRUMENTS INC ]
