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S-1004NB50I-I6T1U 参数 Datasheet PDF下载

S-1004NB50I-I6T1U图片预览
型号: S-1004NB50I-I6T1U
PDF下载: 下载PDF文件 查看货源
内容描述: [Release delay time accuracy]
分类和应用:
文件页数/大小: 42 页 / 4284 K
品牌: SII [ SEIKO INSTRUMENTS INC ]
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BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN  
S-1004 Series  
Rev.2.1_01  
2. Change of detection voltage  
If there is not a product with a specified detection voltage value in the S-1004 Series, the detection voltage can be  
changed by using a resistance divider or a diode, as seen in Figure 41 to Figure 44.  
In Figure 41 and Figure 42, hysteresis width also changes.  
VDD  
VDD  
R
RA  
RA  
100 kΩ  
VDD  
SENSE  
VSS  
VDD  
SENSE  
VSS  
VIN  
VIN  
OUT  
CD  
OUT  
CD  
RB  
RB  
GND  
GND  
Figure 41 Detection voltage change  
when using a resistance divider  
(Nch open-drain output product)  
Figure 42 Detection voltage change  
when using a resistance divider  
(CMOS output product)  
RA + RB  
Remark Detection voltage =  
• −VDET  
VHYS  
RB  
RA + RB  
Hysteresis width =  
RB  
VDD  
VDD  
Vf1  
Vf1  
R
100 kΩ  
VIN  
VIN  
VDD  
SENSE  
VSS  
VDD  
SENSE  
VSS  
OUT  
CD  
OUT  
CD  
GND  
GND  
Figure 43 Detection voltage change  
when using a diode  
Figure 44 Detection voltage change  
when using a diode  
(Nch open-drain output product)  
(CMOS output product)  
Remark Detection voltage = Vf1 + (VDET  
)
Caution 1. The above connection diagram and constant will not guarantee successful operation.  
Perform thorough evaluation using the actual application to set the constant.  
2. Set the constants referring to "2. 1 Error when detection voltage is set externally" in  
"Operation".  
34  
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