BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN
S-1004 Series
Rev.2.1_01
Test Circuits
R
VDD
VDD
100 kΩ
VDD
VDD
OUT
CD
OUT
CD
SENSE
VSS
SENSE
VSS
+
+
+
+
V
V
V
V
Figure 7 Test Circuit 1
(Nch open-drain output product)
Figure 8 Test Circuit 1
(CMOS output product)
+
A
VDD
VDD
+
+
VDD
SENSE
VSS
VDD
OUT
CD
V
A
+
VDS
A
OUT
CD
SENSE
VSS
+
V
Figure 9 Test Circuit 2
Figure 10 Test Circuit 3
R
470 kΩ or 100 kΩ
VDD
VDD
VDD
VDD
Oscilloscope
Oscilloscope
OUT
CD
OUT
CD
SENSE
VSS
SENSE
VSS
P.G.
P.G.
Figure 11 Test Circuit 4
(Nch open-drain output product)
Figure 12 Test Circuit 4
(CMOS output product)
VDS
+
V
VDD
VDD
+
+
SENSE
VSS
V
OUT
CD
A
Figure 13 Test Circuit 5
12
SII [ SEIKO INSTRUMENTS INC ]
