PQ1Xxx1M2ZPH Series
Fig.2 Test Circuit for Ripple Rejection
+
1
5
4
ei
~
2
3
eo
V
~
R
L
VIN
V
C
f=400Hz(sine wave)
ei(rms)=100mV
V
V
IN=V
=1.8V
=10mA
RR=20log(ei(rms)/eo(rms))
O(TYP)+1.0V
C
I
O
Fig.3 Power Dissipation vs. Ambient
Fig.4 Overcurrent Protection
Characteristics (Typical Value)
Temperature
400
100
300
200
75
50
100
0
25
0
Ta=25°C
-30 -25
0
25
50
75 85 100 125 150
0
0.1
0.2
0.3
0.4
Ambient temperatureTa (°C)
Output current IO (A)
Note) Oblique line portion:Overheat protection may operate in this area.
Fig.5 Output Voltage Fluctuation vs. Junction
Fig.6 Output Voltage vs. Input Voltage
Temperature (PQ1X301M2ZPH)(Typical Value)
(PQ1X301M2ZPH)(Typical Value)
4
60
50
V
IN=3.8V
I =30mA
O
V
C
=1.8V
40
C
O=4.7μF
3
2
30
(Ceramic capacitor)
20
10
0
T
C
a
=25°C
–10
–20
–30
–40
RL=
IN=1μF
(Ceramic capacitor)
=4.7μF
(Ceramic capacitor)
1
0
C
O
–50
–60
0
1
2
3
4
5
6
7
–30–20 0 20 40 60 80 100 120 140
Junction temperatureT (°C)
Input voltageVIN (V)
j
Sheet No.: OP06028
3
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
