PQxxxDNA1ZPH Series
Fig.2 Test Circuit
VO
VIN
1
3
2
IO
A
VC
5
V
A
1μF
IC
10μF
RL
Iq
A
Fig.3 Test Circuit for Ripple Rejection
+
1
3
2
~
ei
I
O
eo
VC
V
~
5
10μF
1μF
VIN
RL
2.7V
f=120Hz(sine wave)
ei(rms)=0.5V
VIN= 5V (PQ033DNA1ZPH)
7V (PQ050DNA1ZPH)
10V (PQ080DNA1ZPH)
11V (PQ090DNA1ZPH)
14V (PQ120DNA1ZPH)
IO=0.3A
RR=20log(ei(rms)/eo(rms))
Fig.4 Power Dissipation vs. Ambient
Temperature
Fig.5 Overcurrent Protection Characteristics
PQ033DNA1ZPH
(
)
4.0
10
VIN=7V
VIN=9V
3.5
8
3.0
2.5
VIN=12V
V
IN=15V
VIN=3.8V
5
VIN=24V
2.0
1.5
VIN=5V
1.0
0.5
0
V
C
C
C
=2.7V
IN=1μF
=10μF
=Room temp.
O
T
a
0
-40 -20
25 50
0
75 100 125 150
85
0
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
Ambient temperature T
a
(°C)
Output current IO (A)
Note) Oblique line portion:Overheat protection may operate in this area.
Sheet No.: OP06051
4
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
