DG-99lOU
hfODES No.
GSi5i-GT95200.A
JaGG
PAGE
6113
4. Rcliabiliry
The rcliabtity ofptoducrs shallbesatisfied
with items
listedbelow.
r
4-1. Test itemsand:es concliricns
Test items
Testconditions
Confidence
level: 90%
S~plCS
10
10
temperature
cycling
Hieh temp’and‘@
humidicystorage
High temperature
storage
Low temper3rure
storage
-tO~C(jOmin)~+1OOt(3Omin),lCOCy
n=22, c4
n=22,c=4
TazT6$C, NKRK, pI00Oh
Ta=(Tng-maximumratings),r-1030h
Ta=(Tstg-minimunratings),r IOCOh
ITa=25’C,Ie(IF-maximumratings),~lOOOh
15 000m/s',0.5ms,3timesJ~X,iY~Zdirection
ZOOmis', 100-2
OOO-100Wsweepfor
ZOmin.,4times/yY,Z
direction
n=22, c-0
n=22,C=tl
~n=22,c=q
n=ll,C=o
10
IO
10
20
I
Opcratig test
kfechtical shock
Vtiabte frequency
vibration
Soldering
heat
n=I 1,C-0
n=ll,C=o
z”
20
Refer to the attachedsheetgage
12’13 1 time
5-2. Failure
judgemeatcriteria (Sotel)
Parameter
r
Forwardvoltage
Reverse
cuneat
Luminous
intensity
Symbol
VF
IR
IV
Fail
judgementcriteria (Noted)
v,>
I,>
U.S.L. x I.2
U.S.L. ' 2.0
Iv > The
first
stagevalueX 1.5 or The Jirststage
valueX 0.5 > Iv
fiote I)Mcasuringconditioais in accordance specification.
with
(Note2)U.S.L.is shown UpperSpecificationLimit.
by
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
