Model No. GM2BB**GT4E
“Contents in this technical document be changed without any notice due to the product modification.”
http://www.sharp-world.com/products/device/
4．Reliability
ꢀꢀ4-1. Test items and test conditions
ꢀ
（Confidence level：90％）
Samples Defective
LTPD
No.
1
Test items
Test conditions
（％）
n
C
22
0
10
-40℃（30min）to +100℃（30min）,100cycles
Tstg = +60℃,RH = 90%,Time = 1 000h
Temperature cycle
Temperature humidity storage
2
22
22
0
0
10
10
3
High temperature storage
Low temperature storage
Tstg = +100℃,Time = 1 000h
Tstg = -40℃,Time = 1 000h
4
5
22
22
0
0
10
10
Steady state operating life
at room temperature
Tc =25℃,IF = 100 mA,Time = 1 000h
Tc = +100℃,I F= 50 mA,Time = 1 000h
6
7
Steady state operating life
at high temperature
22
22
0
0
10
10
Steady state operating life
at high temperature and
elevated humidity
Tc = +60℃,RH=90%,I F= 100 mA,Time = 500h
2
Acceleration: 15 000 m/s2, Pulse width: 0.5 ms,
8
11
0
20
Shock
Tc = +25 ℃
Direction: X, Y and Z, 3 trials in each direction
7
sharp LD-E7-7-14-A
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
