Model No. GM2BB**QB2C
Contents in this technical document be changed without any notice due to the product modification.
http://www.sharp-world.com/products/device/
4．Reliability
4-1. Test items and test conditions
（Confidence level：90％）
No.
Test items
Test conditions
Samples
Defective
n
C
LTPD
（％）
1
2
Temperature cycle
-40℃（30min）to +100℃（30min）,100cycles
22
22
0
0
10
10
Temperature humidity storage
Tstg = +60℃,RH = 90%,Time = 1 000h
3
High temperature storage
Tstg = +100℃,Time = 1 000h
22
0
10
4
5
Low temperature storage
Tstg = -40℃,Time = 1 000h
22
22
0
0
10
10
Steady state operating life
at room temperature
Tc =25℃,I
F
= 160 mA,Time = 1 000h
6
Steady state operating life
at high temperature
Tc = +100℃,I
F
= 160 mA,Time = 1 000h
22
0
10
7
Steady state operating life
at high temperature and
elevated humidity
Tc = +60℃,RH=90%,I
F
= 100mA,Time = 500h
22
0
10
8
Shock
Acceleration: 15 000 m/s2, Pulse width: 0.5 ms,
Tc = +25 ℃
Direction: X, Y and Z, 3 trials in each direction
2
11
0
20
7
sharp LD-E7-3-14-A
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
