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GL5ZR302BOS 参数 Datasheet PDF下载

GL5ZR302BOS图片预览
型号: GL5ZR302BOS
PDF下载: 下载PDF文件 查看货源
内容描述: 设备规格发光二极管 [DEVICE SPECIFICATION FOR Light Emitting Diode]
分类和应用: 二极管
文件页数/大小: 11 页 / 591 K
品牌: SHARP [ SHARP ELECTRIONIC COMPONENTS ]
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DG99603 1
MODEL No.
JLud16/9!I
PAGE
GL5ZR302BOS
5110
4. Reliability
The reliability of productsshallbe satisfiedwith items listed below.
L
Cl. Test itemsandtestconditions
Test items
Solderability
Soldering
temperature
Mechanical shock
Variable frequency
vibration
Terminal strength
(Tension)
Terminal strength
(Bending)
Temperature
cycling
High temp. andhigh
humidity storage
Test conditions
230t5”C, 5s
Prior disposition: Dip in rosin flux
260f5”C;
5s
Confidencelevel: 90’
Samples
(n) LTPC
Defective (C)
@IO)
n=ll, C=O
n=ll, C=O
n=ll, C=O
n=ll.C=O
n=ll,C=O
n=ll, C=O
n=22, C=O
n=22. C=O
n=22, C=O
n=22, C=O
n=22, C=O
20
20
20
20
20
20
10
10
10
10
10
15 OOOm/sz,
05ms,
3timesI 33SYptZ direction
2OOm/s*, to 2 000 to lOOHz/sweep 4min.
100
for
,4times/S&Y&Z direction
Weight: ION, S/each terminal
Weight:SN,O” + 90” --) O”* -90” + 0”
/each terminal
40~(3Omin)~+100”c(3Omin),30 cycles
Ta=+60”C, 9O%RH,t=lOOOh
I!
Iigh temperature
storage
Ta=lOO”C, t=lOOOh
Low temperature
storageTa=4O”c, t=lOOOh
Operation life
Ta=25”c, IFMAX. t=lOOOh*3
4-2. Measurement
itemsandFailure judgementcriteria * 1
Measurement
Forward voltage
Reversecurrent
Luminousintensity
Symbol
vF
Failurejudgementcriteria *2
VF > U.S.L. x 1.2
IR > U.S.L. x 2.0
Iv > The first stagevalueX 2.0 or The first stagevalueX 0.5 > Iv
IR
Iv
s Solderability : Soldershallbe adhere the areaof 95% or moreof dippedpotion.
at
g Terminal strength: Packageis not destroyed,and terminal is not slack.
* 1: Measuringcondition is in accordance
with specification.
*2: U.S.L. is shownby UpperSpecificationLimit.
*3: IF MAXis shownby forward current of absolute
maximum ratings.