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GL5ZJ302BOS 参数 Datasheet PDF下载

GL5ZJ302BOS图片预览
型号: GL5ZJ302BOS
PDF下载: 下载PDF文件 查看货源
内容描述: 设备规格发光二极管 [DEVICE SPECIFICATION FOR Light Emitting Diode]
分类和应用: 二极管
文件页数/大小: 11 页 / 591 K
品牌: SHARP [ SHARP ELECTRIONIC COMPONENTS ]
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DC3996030
Junl16/94
MODEL No.
GL5a302BOS
PAGE
S/10
4. Reliability
The reliability of productsshallbe satisfiedwith itemslistedbelow.
A
l-1. Test itemsand test conditions
Test items
Solderability
Soldering
temperature
Mechanicalshock
Variable frequency
vibration
Terminal strength
(Tension)
Terminalstrength
(Bending)
Temperature
cycling
High temp.andhigh
humidity storage
Test conditions
230*5”c. 5s
Prior disposition: Dip in rosinflux
260tPC,
5s
Confidencelevel: 909
6
Samples
(n)
LTPD
Defective (C)
(Q/o)
3
n=ll, C=O
n=ll,C=O
n=ll. C=O
n=ll, C=O
n=ll, C=O
n=ll,C=O
n=22, C=O
n=22, C=O
n=22, C=O
n=22, C=O
n=22, C=O
20
20
20
20
20
20
10
10
10
10
10
15 OOOm/sz,
OSms,
3times/ iSgtY,kZ direction
2OOm/s*, to 2 Oooto lOOHz/sweep 4min.
100
for
.4times/fX+Y,iZ direction
Weight:lON, S/each terminal
Weight:SN, 0” - 90” -+ O”* -90” + 0”
/each terminal
-4O”c(3Omin)~+lOO”c(3~in),3O cycles
Ta=+60%, 9O%RH,t=lOOOh
tigh temperature
storageTa=lOO”C, t=lOOOh
x)w temperature
storageTa=-40”C, t=lOOOh
Operationlife
Ta=25”c. IFMAX, t=1000h *3
4-2. Measurement
itemsand Failurejudgementcriteria * 1
Measurement
Forward voltage
Reversecurrent
Luminousintensity
SpbOl
vF
Failurejudgementcriteria *2
v, > U.S.L. x 1.2
I, > U.S.L. x 2.0
Iv > The fist stage
value X 2.0 or The first stagevalue X 0.5 >
Iv
IR
Iv
Z Solderability : Sol&r shallbe adhereat the areaof 95% or moreof dippedportion.
z Terminalstrength: Packageis not destroyed,andterminalis not slack.
* 1: Measuringcondition is in accordancewith specification.
*2: U.S.L. is shownby Upper Specification Limit.
*3: IF MAX.is shownby forward current of absolute
maximumratings.