5. RELIABLITY TESTS
Item
Condition
Note
Failures
0/22
Life Test
Ta = RT, IF = 50mA
Ta = 100ºC, IF = 10mA
1000hrs
1000hrs
High Temperature
Operating
0/22
Low Temperature
Operating
Ta = -40ºC, IF = 20mA
1000hrs
100cycles
100cycles
10cycles
1 time
0/22
0/50
0/50
0/50
0/50
0/22
0/50
0/50
0/50
0/22
Ta = -40ºC (30min) ~ 105º (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
Thermal Shock
Ta = -40ºC (25min) ~ 25ºC (5min) ~
Temperature Cycle
105ºC (25min) ~ 25ºC (5min)
Moisture Resistance
Cycle
Ta = 25ºC ~ 65ºC ~ -10ºC, RH = 90%
(1Cycle = 24hrs)
Resistance to soldering
Heat
Ts = 260 ± 5ºC, t = 10 ± 1sec
1kV, 1.5kΩ ; 100pF
Ta = 105ºC
ESD
1 time
(Human Body Model)
High Temperature
Storage
1000hrs
1000hrs
1000hrs
100hrs
Low Temperature
Storage
Ta = -40ºC
Temperature Humidity
Storage
Ta = 85ºC, RH = 85%
Ta = 85ºC, RH = 85%
IF = 15mA
Temperature Humidity
Operating
< Judging Criteria For Reliability Tests >
VF
USL 1 X 1.2
IR
USL X 2.0
LSL 2 X 0.7
IV
Notes : 1. USL : Upper Standard Level
2. LSL : Lower Standard Level.
<050201> Rev. 0.0
LI521
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SEOUL [ Seoul Semiconductor ]
