*CIE RANK
<IF=20mA, Ta=25℃>
I2
I3
I4
x
y
x
y
x
y
0.2990
0.3015
0.3055
0.3030
J2
0.3010
0.2955
0.3025
0.3080
0.3015
0.3040
0.3080
0.3055
0.2955
0.2900
0.2970
0.3025
0.3040
0.3065
0.3105
0.3080
0.2900
0.2845
0.2915
0.2970
J3
J4
K4
L4
x
y
x
y
x
y
0.3030
0.3055
0.3095
0.3070
K2
0.3080
0.3025
0.3095
0.3150
0.3055
0.3080
0.3120
0.3095
0.3025
0.2970
0.3040
0.3095
0.3080
0.3105
0.3145
0.3120
0.2970
0.2915
0.2985
0.3040
K3
x
y
x
y
x
y
0.3070
0.3095
0.3135
0.3110
L2
0.3150
0.3095
0.3165
0.3220
0.3095
0.3120
0.3160
0.3135
0.3095
0.3040
0.3110
0.3165
0.3120
0.3145
0.3185
0.3160
0.3040
0.2985
0.3055
0.3110
L3
x
y
x
y
x
y
0.3110
0.3135
0.3175
0.3150
0.3220
0.3165
0.3235
0.3290
0.3135
0.3160
0.3200
0.3175
0.3165
0.3110
0.3180
0.3235
0.3160
0.3185
0.3225
0.3200
0.3110
0.3055
0.3125
0.3180
Rev. 00
January, 2009
www.acriche.com
Document No. : SSC-QP-7-07-24 (Rev.00)
*Measurement Uncertainty of the Color Coordinates : ± 0.007
SEOUL [ Seoul Semiconductor ]
