11. Reliability Test Item and Condition
Duration Number of
Item
Reference
Test Condition
/ Cycle
Damage
Thermal Shock EIAJ ED-4701 Ta =-40oC (30MIN) ~ 100oC (30MIN) 100 Cycle
0/22
Temperature
Cycle
Ta =-40oC (30MIN) ~ 25oC (5MIN)
EIAJ ED-4701
EIAJ ED-4701
100 Cycle
0/22
0/22
~ 100oC (30MIN) ~ 25oC (5MIN)
High Temperature
Storage
1000
Ta =100oC
Hours
High Temperature
High Humidity
Storage
1000
EIAJ ED-4701
Ta =85oC, RH=85%
0/22
Hours
Low Temperature
1000
EIAJ ED-4701
Ta =-40oC
0/22
0/22
Storage
Hours
Operating
Internal
1000
Ta =25oC, IF =20mA
Endurance Test
Reference
Hours
High Temperature
High Humidity
Life Test
High Temperature
Life Test
Internal
Ta =85oC, RH=85%, IF =15mA
Ta =85oC, IF =20mA
300 Hours
0/22
0/22
Reference
Internal
500
Reference
Hours
Low Temperature
Life Test
Internal
1000
Ta =-40oC, IF =20mA
1KV at 1.5kΩ; 100pF
0/22
0/22
Reference
Hours
MIL-STD-
ESD(HBM)
3 Time
883D
Criteria for Judging the Damage
Criteria for Judgement
Item
Symbol
Condition
MIN
MAX
Forward Voltage
Reverse Current
Luminous Intensity
VF
IR
IF =20mA
VR=5V
-
USL*1 × 1.2
USL*1 × 2.0
-
IV
IF =20mA
LSL*2 × 0.5
-
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
Rev. 00
November 2007
www.ZLED.com
Document No. : SSC-QP-7-07-24 (Rev.00)
SEOUL [ Seoul Semiconductor ]
