12. Reliability Test Item and Condition
Number
of
Damage
Duration
/ Cycle
Item
Reference
Test Condition
EIAJ ED-
4701
Ta =-40oC (30MIN) ~ 100oC
100
Cycle
Thermal Shock
0/22
0/22
(30MIN)
Temperature
Cycle
EIAJ ED-
4701
Ta =-40oC (30MIN) ~ 25oC (5MIN)
100
Cycle
~ 100oC (30MIN) ~ 25oC (5MIN)
High
Temperature
Storage
EIAJ ED-
4701
1000
Hours
Ta =100oC
0/22
0/22
High
Temperature
High Humidity
Storage
EIAJ ED-
4701
1000
Hours
Ta =85oC, RH=85%
Low
Temperature
Storage
EIAJ ED-
4701
1000
Hours
Ta =-40oC
0/22
0/22
Operating
Endurance Test Reference
Internal
1000
Hours
Ta =25oC, IF =20mA
High
Temperature
High Humidity
Life Test
Internal
Reference
300
Hours
Ta =85oC, RH=85%, IF =15mA
Ta =85oC, IF =20mA
0/22
0/22
High
Temperature
Life Test
Internal
Reference
500
Hours
Low
Temperature
Life Test
Internal
Reference
1000
Hours
Ta =-40oC, IF =20mA
1KV at 1.5kΩ; 100pF
0/22
0/22
MIL-STD-
883D
ESD(HBM)
3 Time
Criteria for Judging the Damage
Criteria for Judgement
Item
Symbol
Condition
MIN
-
MAX
Forward Voltage
Reverse Current
VF
IR
IF =20mA
VR=5V
USL*1 × 1.2
-
USL*1 × 2.0
Luminous
Intensity
IV
IF =20mA
LSL*2 × 0.5
-
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
Rev. 00
October 2008
www.ZLED.com
Document No. : SSC-QP-7-07-24 (Rev.00)
SEOUL [ Seoul Semiconductor ]
