5. Reliability Test
Number
of
Damaged
Duration /
Cycle
Item
Reference
Test Conditions
EIAJ
ED-4701
Ta =-40oC(30min) ~
1000
Cycle
Thermal Shock
0/22
0/22
0/22
0/22
0/22
100oC(30min)
High Temperature
Storage
EIAJ
ED-4701
Ta =100oC
Ta =60oC, RH=90%
Ta =-40oC
1000 Hours
1000 Hours
1000 Hours
1000 Hours
High Temp. High
Humidity Storage
EIAJ
ED-4701
Low Temperature
Storage
EIAJ
ED-4701
Operating
Endurance Test
Internal
Reference
Ta =25oC, IF =60mA
High Temperature
High Humidity Life
Test
Internal
Reference
500
Hours
Ta =60oC, RH=90%, IF =60mA
Ta =85oC, IF =60mA
0/22
0/22
High Temperature
Life Test
Internal
Reference
1000 Hours
Low Temperature
Life Test
Internal
Reference
Ta =-40oC, IF =60mA
1KV at 1.5kΩ; 100pF
1000 Hours
3 Time
0/22
0/22
MIL-STD-
883D
ESD(HBM)
□ CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgment
Item
Symbol
Condition
MIN
MAX
USL*1 × 1.2
USL*1 × 2.0
-
IF =60mA
(20mA per die)
Forward Voltage
Reverse Current
Luminous Intensity
VF
IR
IV
-
VR=5V
-
IF =60mA
(20mA per die)
LSL*2 × 0.5
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
Rev. 03
June 2009
www.acriche.com
SSC-QP-7-07-24 (Rev.00)
SEOUL [ Seoul Semiconductor ]
