5027 series
MEASUREMENT CIRCUITS
Measurement cct 1
Measurement cct 4
Measurement parameter: I , I , Duty, t , t
Measurement parameter: V , V
DD ST
r
f
IH IL
I
I
DD
ST
A
VDD
VDD
XT
XT
IDD: Open
0.1µF
X'tal
Q
X'tal
Q
0.1µF
XTN
XTN
INHN VSS
INHN VSS
CLOUT = 15pF
V
V
IH
(Including probe
V
I
I
DD: Open
ST: Short
IL
capacitance)
Note: The AC characteristics are observed using an oscilloscope on
pin Q.
V : Voltage in V to V transition that changes the output state.
IH SS DD
V : Voltage in V to V transition that changes the output state.
IL
DD
SS
INHN has an oscillation stop function.
Measurement cct 2
Measurement parameter: t
Measurement cct 5
Measurement parameter: I
OD
Z
VDD
VDD
0.1µF
V
DD
or
SS
0.1µF
Q
Q
A
C1
Signal
Generator
V
XTN
RL
IZ
INHN VSS
CLOUT
INHN VSS
R1
V
DD
or
SS
V
XTN input signal: 1Vp-p, sine wave
: 15pF
Measurement cct 6
C1: 0.001µF
R1: 50Ω
C
LOUT
Measurement parameter: R , R
UP1 UP2
R : 1kΩ
L
Measurement cct 3
VDD
Measurement parameter: V , V
OH OL
0.1µF
0.1µF
INHN VSS
VDD
VSS
50Ω
Q
V
DD
0.001µF
50Ω
R
R
UP1
UP2
=
=
Signal
Generator
IUP
(VIN = 0V)
A
XTN
IUP
VIN
V
VOH
0.1µF
VS
V
V
DD 0.7VDD
VOL
(VIN = 0.7VDD
)
IUP
∆V
VOH
VS
VS
VOL
∆V
V
50 × I
adjusted such that ∆V =
OH
V adjusted such that ∆V =
S
50 × I .
OL
S
.
XTN input signal: 1Vp-p, sine wave
SEIKO NPC CORPORATION —14
SEIKO [ SEIKO EPSON CORPORATION ]
