SMD Type
Characteristic
High Dielectric Constant Type
Characteristic
High Dielectric Constant Type
Test Methods
and Conditions
Test Methods
and Conditions
Item
Item
No.
No.
Temperature
Compensating Type
Temperature
Compensating Type
8
Temperature Appearance
Cycle
No marking defects
Perform the five cycless according
to the four heat treatments listed in
the following table.
11 Bending
Strength
- Substrate Material :
Glass EPOXY Board
Capacitance Within
±2.5% or ±0.25㎊ X7R, X5R : Within ±7.5%
(whichever is larger) Y5V
- Board Thickness :
1.6mm
0.8mm(0603/1005size)
Step
1
2
3
4
Change
: Within
±
20%
Min.
Max.
Dissipation
Factor
30㎊ Min. :
Q≥1,000 (DF≤0.1%)
Temp. Operating Room Operating Room
Char. 50V Min. 25V
16V
10V
7.5%/
6.3V
7.5%/
(
℃
)
Temp.
+0, -3
Temp.
Temp. Temp.
+3, -0
※Test Condition
- Bending Limit : 1mm
- Pressurizing Speed : 1mm/sec
X7R
X5R
≤
5%/
≤5%/
≤
≤
5%/
10%
≤
ꢌ
≤
(or Q)
Time
(Min)
30㎊ Max. :
Q≥400+20C
(DF≤1/(400+20C))
ꢌ≤
7.5% ꢌ≤10%
ꢌ
≤12.5%
ꢌ≤12.5%
30±3
2 to 3
30±3
2 to 3
≤
7.5%/
≤10%/
≤
12.5%
≤15%/
Y5V
≤20%
- Initial measurement
Perform a heat treatment at 150+0,
ꢌ≤
12.5%
ꢌ≤12.5%
ꢌ≤15% ꢌ≤20%
-10℃ for one hour and then let sit
for 48±4 hours at room temperature.
- Measurement after test
Take it out and set it for 24
±2 hours
No cracking or marking defects shall occur
(temperature compensating) or
48 4 hours(high dielectric constant
±
Capacitance Within
±
5% or
±0.5㎊
X7R, X5R : Within ±12.5%
I.R.
More than 10,000MΩor 500Ω.F(Whichever is smaller)
type) at room temperature, then
measure.
Change (whichever is larger)
Y5V
: Within
±30%
Vibration
12
ꢌ
Shown in Fig. After soldering and
then let sit for 24+4hr(temperature
compensating type), 48±4hr (high
dielectric constant type) at room
temperature.
Appearance No defects or abnormalities
Capacitance Whin the specified tolerance
9
Humidity
Load
Appearance
No marking defects
- Temperature : 40
- Humidity : 90~95%
- Hour : 500 12hrs
- Test Voltage : The rated voltage
- Take it out and set it for 24 2 hours
(temperature compensating) or
48 4 hours(high dielectric constant
type) at room temperature, then
measure.
The charge/discharge current is
less than 50mA
±2℃
Resistance
Capacitance Within
Change
±7.5% or
±0.75㎊ X7R, X5R : Within
±
12.5%
30%, -40%
(Y5V/1.0㎌, 2.2㎌, 4.7㎌/10V)
Within 30% (others)
±
(whichever is larger) Y5V
: Within +
30㎊ Min. :
Q/DF
Char. 50V Min. 25V
16V
10V
5%/
6.3V
5%/
Q 1,000 (DF 0.1%)
The capacitor should be subjected
to a simple harmonic motion having
a total amplitude of 1.5mm, the
frequency being varied uniformly
between the approximate limits of
10 and 55Hz, shall be traversed(from
10Hz to 55Hz then 10Hz again) in
approximately 1 minute.
This motion shall be applied for a
period of 2 hours in each 3mutually
perpendicular directions(total is
6hours).
X7R
X5R
≤
2.5%/
5%
≤
3%/
7%
≤
3.5%/
7%
≤
≤
±
±
ꢌ≤
ꢌ≤
ꢌ≤
ꢌ≤10%
ꢌ≤10%
30㎊ Max. :
Q 400+20C
≤
5%/
9%
≤7%/
≤9%
≤
12.5%/
15%
±
30㎊ Min. :
Q≥200 (DF≤0.5%)
Dissipation
Factor
Char. 50V Min. 25V
16V
5%/
10V
7.5%/
6.3V
7.5%/
Y5V
≤15%
ꢌ≤
ꢌ≤
9%
ꢌ
≤12.5%
ꢌ≤
(DF 1/ (400+20C))
X7R
X5R
≤
5%/
≤5%/
≤
≤
≤
(or Q)
ꢌ≤
7.5% ꢌ≤
10%
ꢌ
≤10%
ꢌ≤12.5%
ꢌ≤12.5%
30㎊ Max. :
Q≥100 +10/3C
(DF≤1/(100+10/3C))
≤
7.5%/
12.5%
≤
10%/
≤
12.5%
≤
ꢌ≤20%
15%/
Y5V
≤20%
ꢌ≤
ꢌ≤
12.5%
ꢌ
≤15%
I.R.
More than 500MΩor 25Ω.F(Whichever is smaller)
Appearance
No marking defects
High
Temperature
Load
10
- Testing time : 1000±12hrs
Capacitance
Change
Within
±3% or
±0.3㎊
X7R, X5R : Within
±
±
+
12.5%
30%(Cap. < 1.0㎌)
30%, -40%
- Applied voltage :
Rated voltage < DC250V : ×200%
- Temperature :
13 Humidity
Steady
Appearance No marking defects
Capacitance Within 5% or 0.5
- Temperature : 40±2℃
- Humidity : 90~95%
- Hour : 500±12hours
(whichever is larger) Y5V
: Within
Within
±
±
㎊
X7R, X5R : Within
Y5V : Within
±12.5%
30%
State
Change
(whichever is larger)
±
(Cap. ≥1.0㎌)
C0G, X7R → 125±3℃
- Measurement after test
X5R , Y5V → 85±3℃
Dissipation
(or Q)
30㎊ Min. :
Q≥350 (DF≤0.3%)
Char. 50V Min. 25V
16V
10V
6.3V
7.5%/
Dissipation
Factor
Take it out and set it for 24±2 hours
(temperature compensating type) or
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
30㎊ Min. :
Q≥350 (DF≤0.3%)
Char. 50V Min. 25V
16V
5%/
10V
7.5%/
6.3V
7.5%/
- Measurement after test
Take it out and set it for 24±2
hours(temperature compensating
type)or 48±4 hours (high dielectric
constant type) at room temperature,
then measure.
X7R
X5R
≤
5%/
7.5% ꢌ
≤5%/
≤
5%/
10%
≤
≤
7.5%/
12.5%
≤
X7R
X5R
≤
5%/
≤5%/
≤
≤
≤
10㎊≤Cp ≤30㎊ :
ꢌ≤
≤
10%
ꢌ≤
ꢌ
ꢌ≤
12.5%
(or Q)
10㎊≤Cp ≤30㎊ :
Q≥275 +5/2C
(DF≤1/(275+5/2C))
ꢌ≤
7.5% ꢌ≤
10% ꢌ
≤10%
ꢌ≤12.5%
ꢌ≤12.5%
Q≥275 +5/2C
(DF≤1/(275+5/2C))
≤7.5%/
≤10%/
≤
12.5%
15%
≤
15%/
20%
Y5V
≤20%
≤
7.5%/
≤
10%/
≤
12.5% ≤15%/
ꢌ≤
12.5%
ꢌ≤
12.5%
ꢌ≤
ꢌ≤
Y5V
≤20%
ꢌ≤12.5% ꢌ≤12.5% ꢌ≤15% ꢌ≤20%
10㎊ Max. :
Q≥200+10C
(DF≤1/(200+10C))
10㎊ Max. :
Q≥200+10C
(DF≤1/(200+10C))
The charge/discharge current is
less than 50mA.
I.R
More than 1,000MΩor 50Ω.F (Whichever is Smaller)
I.R.
More than 10,000MΩor 50Ω.F(Whichever & Smaller)
22
23
SAMWHA CAPACITOR Co., Ltd.
Multi Layer Ceramic Capacitors
SAMWHA [ SAMWHA ELECTRIC ]
