DPS-081104
CHIP BEADS
Reliability & Test Condition
Item
Requirements
Test Conditions
Temperature : 40 ± 2 ℃
Humidity : 90 ± 2 % RH
Applied current : rated current
Time : 500 ± 12 hours
Humidity load
resistance
Measurement at room ambient
temperature after placing for 24 hours
Temperature : -55 ± 3 ℃
Low temperature
resistance
Time : 1000 ± 12 hours
Measurement at room ambient
temperature after placing for 24 hours
1. No mechanical damage
2. Impedance shall not change more than ±30 %
1. -55 ± 3℃ for 30 minutes
2.125 ± 3 ℃ for 30 minutes
3. repeat 100 cycle
Thermal shock
Frequency : 10 ~ 55 Hz
Amplitude : 1.5 mm
Vibration
Drop
Direction : X, Y, Z
Sweep time : 2 hours for each axis
Drop 10 times on a concrete floor
from a height of 100 cm
W
No mechanical damage
1005
1608
2012
3216
4516
4532
ITEM
R0.5
A
0.7
1.0
1.0
1.3
1.5
1.5
(mm)
Flexure strength
C
B
0.5
0.7
0.7
0.8
1.3
2.0
1.0
1.3
4.0
1.5
3.0
5.0
3.6
3.0
5.0
3.6
3.8
5.0
(mm)
C
(mm)
A
B
A
W
(kgf)
20
50
W
R340
The terminal electrode shall be neither break off
nor the chip damage
Bending strength
2 mm
Resistance meter
This description in the this catalogue is subject to change without notice
http://www.samwha.com/chip
SAMWHA ELECTRONICS CO., LTD