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CL21A226MPCLRNC 参数 Datasheet PDF下载

CL21A226MPCLRNC图片预览
型号: CL21A226MPCLRNC
PDF下载: 下载PDF文件 查看货源
内容描述: 规范 [SPECIFICATION]
分类和应用:
文件页数/大小: 2 页 / 139 K
品牌: SAMSUNG [ SAMSUNG SEMICONDUCTOR ]
 浏览型号CL21A226MPCLRNC的Datasheet PDF文件第1页  
Performance
Vibration Test
Capacitance change :
Tan
δ,
IR : initial spec.
Moisture
Resistance
Capacitance change :
Tan
δ
: 0.2 max
IR
High Temperature
Resistance
: More than 12.5㏁·㎌
within ±12.5%
With 100%
within ±12.5%
within ±5%
Test condition
Amplitude : 1.5mm
From 10㎐ to 55㎐ (return : 1min.)
2hours
3 direction (x, y, z)
With rated voltage
40±2℃, 90~95%RH, 500+12/-0 hour
Capacitance change :
Tan
δ
: 0.2 max
IR
of the rated voltage
Max. operating temperature
1000+48/-0 hour
: More than 25㏁·㎌
within ±7.5%
1 cycle condition
Min. operating temperature
25℃
25℃
Max. operating temperature
Temperature
Cycling
Capacitance change :
Tan
δ,
IR : initial spec.
5 cycles test
C. Recommended Soldering method :
Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max )
* For the more detail Specification, Please refer to the Samsung MLCC catalogue.