Electrical Characteristics (TA=25°C Unless Otherwise Noted)
RU2H50S
Symbol
Parameter
Test Condition
Unit
Min. Typ. Max.
Static Characteristics
BVDSS Drain-Source Breakdown Voltage
V
VGS=0V, IDS=250mA
200
VDS= 200V, VGS=0V
1
IDSS Zero Gate Voltage Drain Current
mA
TJ=85°C
30
VGS(th) Gate Threshold Voltage
IGSS Gate Leakage Current
V
VDS=VGS, IDS=250mA
2
3
4
VGS=±25V, VDS=0V
nA
±100
④
Drain-Source On-state Resistance VGS= 10V, IDS=28A
36
43
mW
RDS(ON)
Diode Characteristics
④
Diode Forward Voltage
ISD=28A, VGS=0V
1.2
V
VSD
trr
Reverse Recovery Time
212
980
ns
ISD=28A, dlSD/dt=100A/ms
Qrr
Reverse Recovery Charge
nC
⑤
Dynamic Characteristics
RG
Ciss
Coss
Crss
Gate Resistance
VGS=0V,VDS=0V,F=1MHz
W
3.8
4550
620
155
18
Input Capacitance
VGS=0V,
VDS=50V,
Frequency=1.0MHz
pF
Output Capacitance
Reverse Transfer Capacitance
td(ON) Turn-on Delay Time
tr Turn-on Rise Time
td(OFF) Turn-off Delay Time
tf Turn-off Fall Time
VDD=100V, RL=35W,
IDS=28A, VGEN= 10V,
RG=6W
70
ns
56
45
⑤
Gate Charge Characteristics
Qg
Qgs
Qgd
Total Gate Charge
160
29
208
VDS=160V, VGS= 10V,
IDS=28A
nC
Gate-Source Charge
Gate-Drain Charge
70
Notes:
Pulse width limited by safe operating area.
Calculated continuous current based on maximum allowable junction temperature. Current limited by
bond wire.
Limited by TJmax, IAS =20A, VDD = 60V, RG = 47Ω , Starting TJ = 25°C.
Pulse test ; Pulse width£300ms, duty cycle£2%.
Guaranteed by design, not subject to production testing.
2
CopyrightÓ Ruichips Semiconductor Co., Ltd
Rev. A– FEB., 2012
www.ruichips.com
RUICHIPS [ RUICHIPS SEMICONDUCTOR CO., LTD ]
