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ADM2209EARU-REEL 参数 Datasheet PDF下载

ADM2209EARU-REEL图片预览
型号: ADM2209EARU-REEL
PDF下载: 下载PDF文件 查看货源
内容描述: [HEX LINE TRANSCEIVER, PDSO38, TSSOP-38]
分类和应用: 驱动光电二极管接口集成电路驱动器
文件页数/大小: 14 页 / 832 K
品牌: ROCHESTER [ Rochester Electronics ]
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ADM2209E  
Testing for immunity involves irradiating the device with an EM  
field. There are various methods of achieving this, including use  
of an echoic chamber, stripline cell, TEM cell, GTEM cell. A  
stripline cell consists of two parallel plates with an electric field  
developed between them. The device under test is placed within  
the cell and exposed to the electric field. There are three severity  
levels having field strengths ranging from 1 V to 10 V/m. Results  
are classified in a fashion similar to those for IEC1000-4-4.  
signal lines to minimize crosstalk, without the complication of  
multilayer PCBs.  
Note that the two receivers kept active by the standby supply  
(R5INA and R5INB) should be connected to the Ring In (RI)  
line, so that the system can be awakened when a peripheral  
device begins to communicate.  
FAIL-SAFE RECEIVER OUTPUTS  
1. Normal operation.  
The ADM2209E has fail-safe receiver outputs that assume a  
high output level if the receiver input is zero or open-circuit.  
2. Temporary degradation or loss of function that is self-  
recoverable when the interfering signal is removed.  
LAPLINK COMPATIBILITY  
3. Temporary degradation or loss of function that requires  
operator intervention or system reset when the interfering  
signal is removed.  
The ADM2209E can operate up to 460 kbps data rate under  
maximum driver load conditions of CL = 1000 pF and  
RL = 3 kat minimum power supply voltages.  
4. Degradation or loss of function that is not recoverable due to  
damage.  
DCD  
DSR  
RxD  
RTS  
TxD  
DCD  
DSR  
RxD  
RTS  
TxD  
CTS  
DTR  
RI  
R1  
R2  
R3  
T1  
T2  
R4  
1
2
3
4
5
The ADM2209E easily meets Classification 1 at the most strin-  
gent (Level 3) requirement. In fact, field strengths up to 30 V/m  
showed no performance degradation and error-free data trans-  
mission continued even during irradiation.  
6
7
8
9
9-WAY D  
CONNECTOR  
COM1  
CTS  
DTR  
RI  
Table VII. Test Severity Levels (IEC1000-4-3)  
Field Strength  
T3  
R5  
SUPER I/O  
CHIP  
Level  
V/m  
ADM2209E  
1
2
3
1
3
10  
R1  
R2  
R3  
T1  
T2  
R4  
T3  
R5  
DCD  
DSR  
RxD  
DCD  
DSR  
RxD  
RTS  
TxD  
1
2
3
6
7
8
9
EMISSIONS/INTERFERENCE  
RTS  
TxD  
CTS  
DTR  
EN55 022, CISPR22 defines the permitted limits of radiated  
and conducted interference from Information Technology (IT)  
equipment. The objective of the standard is to minimize the  
level of emissions, both conducted and radiated.  
9-WAY D  
CONNECTOR  
COM2  
CTS  
DTR  
RI  
4
5
RI  
APPLICATIONS INFORMATION  
+3V or +5V  
+12V  
In a typical Data Terminal Equipment (DTE) to Data Circuit  
Terminating Equipment (DCE) 9-lead de facto interface imple-  
mentation, two data lines (TxD and RxD) and six control lines  
(RTS, DTR, DSR, CTS and RI) are required. With its six  
drivers and ten receivers, the ADM2209E offers a single-chip  
solution for the two RS-232 ports normally supplied as standard  
in a desktop or notebook personal computer, as shown in Figure  
28. The flow-through pinout of the device allows for a very  
simple PCB layout, and allows a ground plane to be placed  
beneath the IC, and ground lines to be inserted between the  
0.1F  
0.1F  
0.1F  
0.1F  
Figure 28. Typical Application for a Dual Serial Port  
REV. 0  
–11–