RT7257B
Parameter
EN Input Threshold
Voltage
Logic-High
Logic-Low
Symbol
V
IH
V
IL
V
UVLO
ΔV
UVLO
I
SS
t
SS
T
SD
V
SS
= 0V
C
SS
= 0.1μF
V
IN
Rising
Test Conditions
Min
2.7
--
3.8
--
--
--
--
Typ
--
--
4.2
320
6
13.5
150
Max
18
0.4
4.5
--
--
--
--
Unit
V
V
mV
μA
ms
°C
Input Under Voltage Lockout
Threshold
Input Under Voltage Lockout
Hysteresis
Soft-Start Current
Soft-Start Period
Thermal Shutdown
Note 1.
Stresses beyond those listed
“Absolute
Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may
affect device reliability.
Note 2.
θ
JA
is measured at T
A
= 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7.
θ
JC
is
measured at the exposed pad of the package.
Note 3.
Devices are ESD sensitive. Handling precaution is recommended.
Note 4.
The device is not guaranteed to function outside its operating conditions.
Copyright
©
2012 Richtek Technology Corporation. All rights reserved.
is a registered trademark of Richtek Technology Corporation.
DS7257B-03
September 2012
www.richtek.com
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