RT7251A/B
Parameter
Minimum On-Time
Input Under Voltage Lockout
Threshold
Input Under Voltage Lockout
Threshold Hysteresis
EN Threshold
Voltage
Logic-High
Logic-Low
Symbol
t
ON
V
UVLO
ΔV
UVLO
V
IH
V
IL
V
EN
= 2V, V
FB
= 1V
t
SS
T
SD
Test Conditions
Min
--
--
--
2.5
--
--
--
--
--
--
--
--
--
--
Typ
100
3.5
200
--
--
1
1
150
15
0.7
130
12
125
10
Max
--
--
--
--
0.4
--
--
--
--
--
--
--
--
--
Unit
ns
V
mV
V
μA
ms
°C
°C
V
mV
Ω
%V
REF
μs
EN Pull Low Current
Soft-Start Period
Thermal Shutdown
Power Good Threshold Rising
Power Good Threshold
Hysteresis
Power Good Pull Down
Resistance
Output OVP Threshold
Output OVP Propagation
Delay
Thermal Shutdown Hysteresis
ΔT
SD
Note 1.
Stresses beyond those listed
“Absolute
Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may
affect device reliability.
Note 2.
θ
JA
is measured at T
A
= 25°C on a high effective thermal conductivity four-layer test board per JEDEC 51-7.
θ
JC
is
measured at the exposed pad of the package.
Note 3.
Devices are ESD sensitive. Handling precaution is recommended.
Note 4.
The device is not guaranteed to function outside its operating conditions.
Copyright
©
2012 Richtek Technology Corporation. All rights reserved.
is a registered trademark of Richtek Technology Corporation.
DS7251A/B-01 April 2012
www.richtek.com
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