RT2825
Parameter
LOWP Threshold
Voltage
High-Level
Low-Level
Symbol
Test Conditions
Min
--
0.8
Typ
--
--
Max
2
--
Unit
V
Note 1.
Stresses beyond those listed
“Absolute
Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect
device reliability.
Note 2.
θ
JA
is measured under natural convection (still air) at T
A
= 25°C with the component mounted on a high effective-
thermal-conductivity four-layer test board on a JEDEC 51-7 thermal measurement standard.
θ
JC
is measured at the
exposed pad of the package.
Note 3.
Devices are ESD sensitive. Handling precaution is recommended.
Note 4.
The device is not guaranteed to function outside its operating conditions.
Copyright
©
2017 Richtek Technology Corporation. All rights reserved.
is a registered trademark of Richtek Technology Corporation.
DS2825-00 May 2017
www.richtek.com
7
RICHTEK [ RICHTEK TECHNOLOGY CORPORATION ]
