RT8055B
Parameter
Peak Current Limit
Under Voltage Lockout
Threshold
Shutdown Threshold
Power Good (PGOOD)
V
OUT
Falling (Fault)
Power Good Threshold
V
OUT
Rising (Good)
V
OUT
Rising (Fault)
V
OUT
Falling (Good)
--
--
--
--
87
90
114
111
--
--
--
--
%V
OUT
%V
OUT
%V
OUT
%V
OUT
V
SHDN
Symbol
I
LIM
V
DD
Rising
V
DD
Falling
V
SHDN
Rising
Test Conditions
Min
3.5
--
--
--
Typ
--
2.4
2.2
Max
--
--
--
Unit
A
V
V
V
V
IN
−
0.85 V
IN
−
0.4
Note 1.
Stresses listed as the above
“Absolute
Maximum Ratings” may cause permanent damage to the device. These are for
stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the
operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended
periods may remain possibility to affect device reliability.
Note 2.
θ
JA
is measured in the natural convection at T
A
= 25°C on a high effective thermal conductivity four layers test board of
JEDEC 51-7 thermal measurement standard. The case point of
θ
JC
is on the exposed pad for the package.
Note 3.
Devices are ESD sensitive. Handling precaution is recommended.
Note 4.
The device is not guaranteed to function outside its operating conditions.
DS8055B-03 April 2011
www.richtek.com
5
RICHTEK [ RICHTEK TECHNOLOGY CORPORATION ]
