RT8016
Parameter
EN Low-Level Input Voltage
Symbol
V
EN_L
Test Conditions
Min
--
--
--
f
OSC
T
SD
V
IN
= 3.6V, I
OUT
= 100mA
1.2
--
100
V
IN
= 3.6V, V
LX
= 0V or V
LX
= 3.6V
t
ON
1
--
Typ
--
1.8
0.1
1.5
160
--
--
120
Max
0.4
--
--
1.8
--
--
100
140
Unit
V
V
V
MHz
°C
%
μA
ns
Under Voltage Lock Out threshold UVLO
Hysteresis
Oscillator Frequency
Thermal Shutdown Temperature
Max. Duty Cycle
LX Current Source
Minimum On-Time
Note 1.
Stresses beyond those listed
“Absolute
Maximum Ratings” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in
the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may
affect device reliability.
Note 2.
θ
JA
is measured at T
A
= 25°C on a single-layer and four-layer test board of JEDEC 51. The measurement case position
of
θ
JC
is on the lead of the package.
Note 3.
Devices are ESD sensitive. Handling precaution is recommended.
Note 4.
The device is not guaranteed to function outside its operating conditions.
Note 5.
ΔV
= I
OUT
x P
RDS(ON)
Note 6.
Guarantee by design.
Note 7.
The start up time is about 300μs.
Copyright
©
2012 Richtek Technology Corporation. All rights reserved.
is a registered trademark of Richtek Technology Corporation.
DS8016-04 February 2012
www.richtek.com
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