HA17339A Series
Test Circuits
1. Input offset voltage (V
IO
), input offset current (I
IO
), and Input bias current (I
IB
) test circuit
Rf 5k
SW1
R
S
50
R 20 k
R
S
50
R 20 k
SW2
V
CC
−
+
R
L
51k
V
O
470µ
+
−
V
SW1
On
Off
On
Off
SW2
On
Off
Off
On
Vout
V
O1
1
V
C1
=
V
2
CC
V
O2
V
O3
V
C2
= 1.4V
V
O4
V
C1
Rf 5 k
V
C2
V
IO
=
I
IO
=
|
V
O1
|
1 + Rf / R
S
|
V
O2
−
V
O1
|
R(1 + Rf / R
S
)
(mV)
(nA)
I
IB
=
|
V
O4
−
V
O3
|
2
⋅
R(1 + Rf / R
S
)
(nA)
2. Output saturation voltage (V
O
sat) output sink current (Iosink), and common-mode input voltage (V
CM
) test circuit
V
CC
50
SW1 1
2
V
C1
V
C2
5k
SW2
1
2
50
−
+
50
1.6k
SW3
4.87k
V
C3
Item V
C1
V
O
sat 2V
V
C2
0V
V
C3
SW1
1
SW2
1
Iosink 2V
V
CM
2V
0V
−1
to
V
CC
1.5V
1
2
Unit
SW3
V
1 at
V
CC
= 5V
3 at
V
CC
= 15V
1
2
mA
Switched 3
V
between
1 and 2
3. Supply current (I
CC
) test circuit
+
1V
−
A
V
CC
I
CC
: R
L
=
∞
Rev.3.00 Mar 10, 2006 page 5 of 14
RENESAS [ RENESAS TECHNOLOGY CORP ]
