TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C
≤
T
C
≤
+125°C
4.5 V
≤
V
DD
≤
5.5 V 1/
unless otherwise specified
Test
Symbol
Group A
subgroups
Device
type
Min
Limits
Unit
Max
5.0
1.0
10
100
24
10
10
mA
pF
pF
mA
mA
Supply current, quiescent
I
DDQ
V
DD
= 5.5 V
V
IN
= 0.0 V
4/
1, 2, 3
01,02
03,04
05,06
07,08
Supply current, dynamic
I
DDU
V
DD
= 5.5 V, TRIM, TRIL =
5.0 V, f = 2 MHz
V
DD
= 5.5 V, TRIM, TRIL =
5.0 V, f = 20 MHz 3/
1, 2, 3
01,02
03,04
01,02
03,04
I
DD
Input capacitance
Output capacitance
Functional testing
Multiply time
5/
t
MPY
C
IN
C
OUT
V
DD
= 5.5 V, TRIM, TRIL =
5.0 V, f = 5 MHz
f = 1.0 MHz
T
C
= 25°C
See 4.3.1c
V
DD
= 4.5 V to 5.5 V
See 4.3.1d
See figure 4 5/
V
DD
= 4.5 V
C
L
= 20 pF minimum
1, 2, 3
4
4
7, 8
9, 10, 11
10
9, 10, 11
9, 10, 11
9, 10, 11
10
9, 10, 11
05,06
07,08
All
All
All
01,03
02,04
05,07
06,08
01,03
02,04
05,06
07,08
01,03
02,04
05,06
07,08
All
01,02
03,04
05,07
06,08
30
25
15
0
15
20
15
70
50
60
45
45
30
22
ns
Output delay
t
D
ns
Input setup time
t
S
9, 10, 11
10
9, 10, 11
ns
Input hold time
3/
t
H
t
PWH
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
ns
ns
Clock pulse width, high
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
5962-88739
SHEET
G
6
RAYTHEON [ RAYTHEON COMPANY ]
