TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
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Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
1*,2,3,7,8,9
1,2,3,4,7,8,9,10,11
1,2,3
Group A test requirements
(method 5005)
Groups C and D end-point
electrical parameters
(method 5005)
* PDA applies to subgroup 1.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C measurement) shall be measured only for the initial test and after process or design changes which
IN
may affect input capacitance. Sample size is 15 devices, all input and output terminals tested, and no failures.
d. Subgroups 7 and 8 shall include verification of the truth table.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.
(2)
T = +125°C, minimum.
A
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
SIZE
STANDARD
5962-86879
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
SHEET
D
11
DSCC FORM 2234
APR 97