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HYS64D128320GU-5-B 参数 Datasheet PDF下载

HYS64D128320GU-5-B图片预览
型号: HYS64D128320GU-5-B
PDF下载: 下载PDF文件 查看货源
内容描述: 42184针无缓冲双倍数据速率内存模块 [42184-Pin Unbuffered Double-Data-Rate Memory Modules]
分类和应用: 存储内存集成电路动态存储器双倍数据速率时钟
文件页数/大小: 42 页 / 2531 K
品牌: QIMONDA [ QIMONDA AG ]
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Internet Data Sheet  
HYS[64/72]D[32/64/128]xxx[G/H]U–[5/6]–B  
Unbuffered DDR SDRAM Modules  
Parameter  
Symbol  
–5  
–6  
Unit  
Note1) / Test  
Condition  
DDR400B  
DDR333  
Min.  
Max.  
Min.  
Max.  
Address and control input hold time  
tIH  
0.6  
0.75  
ns  
ns  
Fast slew rate  
3)4)5)6)10)  
0.7  
0.8  
Slow slew rate  
3)4)5)6)10)  
2)3)4)5)  
2)3)4)5)  
2)3)4)5)  
2)3)4)5)  
Read preamble  
tRPRE  
tRPST  
tRAS  
tRC  
0.9  
0.40  
40  
1.1  
0.9  
0.40  
42  
1.1  
tCK  
tCK  
ns  
ns  
Read postamble  
0.60  
70E+3  
0.60  
70E+3  
Active to Precharge command  
Active to Active/Auto-refresh command  
period  
55  
60  
2)3)4)5)  
Auto-refresh to Active/Auto-refresh  
command period  
tRFC  
70  
72  
ns  
2)3)4)5)  
2)3)4)5)  
2)3)4)5)  
2)3)4)5)  
2)3)4)5)  
2)3)4)5)11)  
Active to Read or Write delay  
Precharge command period  
Active to Autoprecharge delay  
tRCD  
tRP  
15  
15  
18  
18  
ns  
ns  
ns  
ns  
ns  
tCK  
tRAP  
tRCD – tRASmin  
Active bank A to Active bank B command tRRD  
Write recovery time tWR  
10  
15  
12  
15  
Auto precharge write recovery + precharge tDAL  
time  
2)3)4)5)  
Internal write to read command delay  
Exit self-refresh to non-read command  
Exit self-refresh to read command  
Average Periodic Refresh Interval  
tWTR  
tXSNR  
tXSRD  
tREFI  
2
7.8  
1
7.8  
tCK  
ns  
2)3)4)5)  
75  
200  
75  
200  
2)3)4)5)  
tCK  
µs  
2)3)4)5)12)  
1) 0 °C TA 70 °C; VDDQ = 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V (DDR333); VDDQ = 2.6 V ± 0.1 V, VDD = +2.6 V ± 0.1 V (DDR400)  
2) Input slew rate 1 V/ns for DDR400, DDR333  
3) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference level for signals  
other than CK/CK, is VREF. CK/CK slew rate are 1.0 V/ns.  
4) Inputs are not recognized as valid until VREF stabilizes.  
5) The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (note 3) is VTT  
.
6) These parameters guarantee device timing, but they are not necessarily tested on each device.  
7)  
tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific  
voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).  
8) The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge. A valid transition  
is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were previously in progress on the  
bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from  
HIGH to LOW at this time, depending on tDQSS  
.
9) The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but system  
performance (bus turnaround) degrades accordingly.  
10) Fast slew rate 1.0 V/ns, slow slew rate 0.5 V/ns and < 1 V/ns for command/address and CK & CK slew rate > 1.0 V/ns, measured  
between VIH(ac) and VIL(ac)  
.
11) For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock cycle time.  
12) A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.  
Rev. 1.22, 2007-01  
17  
03292006-CXBY-V2JX  
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