AS80SSTVF16859
&
Propagation delay times
V
I(pp)
V
V
ICR
Timing input
ICR
t
t
PHL
PLH
V
V
OH
OL
V
V
TT
TT
Output
LVCMOS RESETB
Input
V
IH
IL
V
/2
DD
V
t
PHL
Output
V
V
OH
OL
V
TT
HIGH-TO-LOW SLEW-RATE MEASUREMENT
LOW-TO-HIGH SLEW RATE MEASUREMENT
VOH
dt_r
dV_r
80%
VOH
Output
80%
20%
dt_f
VOL
Output
dV_f
20%
VOL
Output slew rates over recommended operating free-air temperature range (unless otherwise noted)
V
= 2.5 V + 0.2V *
V
= 2.6 V + 0.1 V *
CC
CC
Parameter
dV/dt_r
From
20%
80%
To
Min
1
Max
Min
1
Max
Unit
V/ns
V/ns
V/ns
80%
20%
4
4
1
4
4
1
dV/dt_f
1
1
dV/dt_∆
20% or 80% 80% or 20%
*For this test condition, VDDQ is always equal to VDD
**Difference between dV/dt_r (rising edge rate) and dV/dt_f (falling edge rate)
8/6/03, v.0.10
Alliance Semiconductor
P. 10 of 13
PULSECORE [ PulseCore Semiconductor ]
