PO3B14A
4:1 Mux/DeMux with Single Enable
High Bandwidth Potato Chip
10/09/07
Power Supply Characteristics
Symbol
Description
Quiescent Power Supply Current
Test Conditions (1)
Vcc=Max, Vin=Vcc or GND
Min
Typ
Max
Unit
Icc
Notes:
1.
2.
3.
4.
5.
-
0.1
3
uA
For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
Typical values are at Vcc = 3.3V, 25°C ambient.
This parameter is guaranteed but not tested.
Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
VoH = Vcc – 0.6V at rated current
Capacitance
Parameters
C
IN
C
OFF(IN)
C
OFF(Y)
C
ON
Notes:
(T
A
= 25°C f = 1 MHz)
Description
Input Capacitance
In Capacitance, Switch Off
Y Capacitance, Switch Off
Y/In Capacitance, Switch On
V
IN
= 0V
Test Conditions
Typ.
3.0
3.5
6.5
10.0
pF
Units
1 This parameter is determined by device characterization but not production tested.
Dynamic Electrical Characteristics Over the Operating Range
(T
A
= -40º to +85º, V
CC
= 3.3V ± 10%)
Parameter
X
TALK
O
IRR
BW
Description
Crosstalk
Off-Isolation
-3dB Bandwidth
Test Condition
R
L
= 100Ω
R
L
= 100Ω
R
L
= 100Ω
Typ.
-60
-60
1.2
Units
dB
GHz
Switching Characteristics over 3.3V Operating Range
Parameters
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Description
Propogation Delay
Bus Enable Time
See Test Diagram
Bus Disable Time
3.0
Conditions
See Test Diagram
Max.
0.3
2.0
ns
Units
3
Copyright
© Potato Semiconductor Corporation
POTATO [ POTATO SEMICONDUCTOR CORPORATION ]
