RELEASED
PMC-Sierra, Inc.
PM9311/2/3/5 ETT1™ CHIP SET
Data Sheet
PMC-2000164
ISSUE 3
ENHANCED TT1™ SWITCH FABRIC
6 Characteristics
6.1 SIGNAL ASSOCIATIONS
Table 43. Signal Associations
Associated Signals
Symbol
Device
3.3V-tolerant 2.5V CMOS (OOB and Test Interfaces)
mon[15:0], oob_ad[7:0], oob_int_hi[1:0], oob_int_lo[1:0], oob_wait_L, plllock,
lssd_scan_out[15:0], plltest_out
DS
EPP
oob_ad[7:0], oob_int_hi, oob_int_lo, oob_wait_L, soc_out,
lssd_scan_out[15:0], plltest_out
Vol1, Voh1
Ioh1, Iol1,
Zout1, tval1,
tsus1, tr1, tf1
M_ackreg_L, M_pending_L, M_xreset_L, oob_ad[7:0], oob_int_hi,
oob_int_lo, soc_out, plllock, lssd_scan_out[15:0], plltest_out
XBAR
SCHED
mon[15:0], oob_ad[7:0], oob_int_hi, oob_int_lo, soc_out, plllock,
lssd_scan_out[15:0], plltest_out
oob_ad[7:0], oob_clk, oob_devsel0, oob_devsel1, oob_devsel2,
oob_valid_L, pwrup_reset_L, crdcrcen0, crdcrcen1, crden0, crden1, ibpen0,
ibpen1, ce0_io, ce0_scan, ce0_tstm3, lssd_ce1_a,
DS
lssd_ce1_b, lssd_ce1_c1, lssd_ce1_c2,, lssd_ce1_c3,
lssd_scan_in[15:0], plltest_in, test_di1, test_di2, test_lt, test_re, test_ri
oob_ad[7:0], oob_clk, oob_valid_L, pwrup_reset_in_L, ce0_io,
ce0_scan, ce0_test, ce0_tstm3, lssd_ce1_a, lssd_ce1, plltest_in_b,
lssd_ce1_c1, lssd_ce1_c2, lssd_ce1_c3, lssd_scan_in[15:0], test_di1, test_di2,
test_lt, test_re, test_ri
EPP
XBAR
SCHED
Vih1, Vil1,
tsu1, th1
oob_ad[7:0], oob_clk, oob_valid_L, oob_devsel0, oob_devsel1,
oob_devsel2, oob_devsel3, oob_valid_L, pwruprst_L, ce0_io, ce0_scan, lssd_
ce1_a, lssd_ce1_b, lssd_ce1_c1, lssd_ce1_c2, lssd_scan_in[15:0], plltest_in,
test_di1, test_di2, test_lt, test_ri
oob_ad[7:0], oob_clk, oob_valid_L, oob_devsel0, oob_devsel1,
oob_devsel2, oob_devsel3, oob_valid_L, pwrup_reset_in_L, ce0_io, ce0_scan,
ce0_testm3, lssd_ce1_a, lssd_ce1_b. lssd_ce1_c1, lssd_ce1_c2, lssd_ce1_c3,
lssd_scan_in[15:0], plltest_in, test_di1, test_di2, test_lt, test_ri
DS
EPP
oob_clk
oob_clk
oob_clk
oob_clk
tper1, tph1,
tpl1
XBAR
SCHED
PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE
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